X-ray diffraction has undoubtedly been an integral part of materials research. We want to gather the XRD community to share knowledge and gain ideas on how to improve materials research.
For the upcoming series of Malvern Panalytical’s x-ray diffraction workshops across Taiwan, we have invited our senior XRD specialist from our research centre in the Netherlands to share his knowledge. Specialising in thin films and powder x-ray diffractions, he will share his insights on achieving the best XRD data quality and how to obtain the best information out of the materials.

What you will experience from this workshop :
• Phase identification and quantification
• Hands-on experience with the newly installed Empyrean XRD
• How to achieve good data quality with good sample preparation techniques
• Instrument maintenance
• Research applications for powder, thin films and more
• Each participant will also receive a *free* 3-month HighScore Plus software licence (please bring your laptop; MAC not supported)


X 光繞射儀無疑已成為材料研究不可或缺的一部分。因此我們想召集 XRD 界的各位來一同分享知識,並獲得如何改善材料研究的想法。在即將舉辦一系列橫跨台灣的 Malvern Panalytical XRD workshops,我們特別邀請來自荷蘭研究中心的資深 XRD 應用專家來分享,他專精於薄膜及粉末 X 光繞射技術,將和明志科技大學的材料工程系研究先進們一同與我們分享對於得到高品質 XRD 數據的深刻見解,及如何分析並從材料中獲得最佳資訊。


•實際操作使用最新 iCore 與 dCore 光學的 Empyrean XRD 

•物相定性與定量,及其他進階粉末 XRD 分析

•薄膜樣品的 XRR 與殘留應力分析



•免費使用 HighScore 軟體 3 個月


October 24 2019 - October 25 2019
09:00 - 17:00
(GMT+08:00) Taipei
MIng Chi University of Technology, No. 84號, Gongzhuan Road, New Taipei City, Taishan, Taiwan, 243 台灣明志科技大學材料工程系、 新北市泰山區工專路84號、 綜合大樓一樓演講廳
Event type:



Day 1: Applications and achieving better data analysis
0900 Welcome and introduction
0915 Introduction to X-ray diffraction
0945 Introduction to Empyrean advanced multipurpose X-ray diffractometer (Running multiple samples like powder, thin films and nanomaterials)
1030 Tea break
1045 Achieving better data quality with good sample preparation (grinding of powder samples)
1100 Other sample preparation techniques for more accurate data analysis
1130 Preparing and running of samples on the Empyrean multipurpose X-ray diffractometer
1215 Lunch
1315 Introduction to beam geometry (powder, thin films and bulk)
1400 Guest lecture 1
1420 Guest lecture 2
1440 Q & A
1445 Data analysis: Improve your phase search mapping by defining your elemental range
1515 Tea break
1530 Continuation of sample analysis on the Empyrean multipurpose X-ray diffractometer
1645 Maintaining your instrument for optimal performance and results
1700 End

Day 2 Program : Phase identification and quantification with HighScore Plus software
0930 Guest lecture 1
0950 Guest lecture 2
1010 Q & A
1015 Advanced research applications on the Empyrean (In-situ and in operando studies of lithium battery packs, PDF analysis)
1045 Tea break
1100 Phase identification and quantification using the HighScore Plus software (Hands-on)
• Analysis of samples from Day 1
• Bring your own laptop (Apple Mac is not supported)
1215 Lunch
1315 Hands-on data analysis on HighScore Plus (continued)
• XRR analysis
• Residual stress
1430 Thin films analysis
1515 Tea break
1530 Thin films analysis (continued)
1615 Q & A
1630 End

More information

*Complimentary entry upon registration*

Benefit from our full day interactive learning workshop
- Learn about the various applications that you can analyse on the Empyrean
- Pick up tips on how to properly prepare your samples and analyse your data