This 2-day course covers the advanced use of the Zetium XRF spectrometer equipped with the Small Spot Mapping (SSM) option in combination with the SuperQ software. The course is fully dedicated to the analysis of samples using the SSM option. This includes applications making use of standards as well Omnian standardless analysis.

The course is composed of hands-on sessions carried out online using spectrometers in our Application Competence Center, Almelo, The Netherlands.

In depth training on SSM applications:

• Parameter selection

• Qualitative & Quantitative analysis

• Reporting

• Application Setup