Specialized XRD application courses

Specialized courses covering a number of XRD applications from phase analysis to reflectometry and epitaxy; from basic principles to data collection and analysis.

The courses are intended for both new and existing users of Empyrean, X’Pert3 and X’Pert PRO series diffractometers, who want to get in-depth training in special applications and the corresponding Software packages. It is strongly recommended for the new users to follow beforehand the X-Ray Powder Diffraction course, or to have a solid background and hands-on experience in XRD before registering for the Specialized XRD application courses.

Several different courses are offered in the same week (of which a maximum of 3 can be followed in one week). Final scheduling of the courses will be made based upon registrations for each course at 8 weeks prior to commencement.

• Texture analysis using Texture software (1 day)
• Residual stress analysis using Stress Plus software (2 days)
• Reflectometry analysis using AMASS software (2 day)
• Small-Angle X-ray Scattering (SAXS) analysis using EasySAXS software (2 days)
• Pair Distribution Function (PDF) analysis using HighScore Plus (1 day)
• Epitaxial Thin Film analysis using AMASS software (3 days)

Each course starts with the introduction to the basic principles behind the corresponding technique, followed by extensive hands-on training on the latest generation Empyrean and/or corresponding software modules to help you to optimize data collection and analysis procedure specific for your application(s).

Texture analysis using Texture software

The course is intended for both new and existing users of Empyrean and X’Pert series diffractometers (excluding X’Pert3 Powder). For the new users the maximum outcome will be gained if the Texture course is taken after the X-Ray Powder Diffraction course. Starting with the basics of texture analysis and overview of the possible instrumental setups for texture measurements, course participants will go through extensive hands-on training covering data collection strategies and data analysis from single pole figure to the calculation of an orientation distribution function (ODF), providing you the most complete information about texturing of your sample(s).

As a participant you are encouraged to bring with you one or two of your characteristic samples (together with the corresponding safety data sheet).

Course content
In the duration of the course the emphasis will be placed on the following subjects:
• Measurement strategies and set-up of data collection for pole figure(s) and background corrections
• Data treatment: visualization and correction of pole figures
• Construction of the Orientation Distribution Function
• Recalculation of pole figures
• Normalization factors

Residual stress analysis using Stress Plus software

The course is intended for both new and existing users of Empyrean and X’Pert series diffractometers. For the new users the full advantage of the course will be gained if the Stress course is taken after the X-Ray Powder Diffraction course. Theoretical aspects of Residual Stress analysis using XRD and discussion of possible measurement geometries and instrument setup will be followed by extended practical sessions. The main purpose of the course is to teach you how to choose and execute the most appropriate measurement type and analysis strategy suitable for your sample, starting from sample alignment, choice of the wavelength and of the peak position to be analysed, optimization of data collection, all the way to the analysis of the results using the Stress software.

As a participant you are encouraged to bring with you one or two of your characteristic samples (together with the corresponding safety data sheet).

During the course the following aspects will be covered:
• Fundamentals of Residual Stress evaluation using XRD
• Measurement strategies and set-up of data collection for residual stress
• Verification and calibration of the set-up with a stress-free sample
• Chi-tilt and omega-offset stress methods

Reflectometry analysis using AMASS

This course is intended for users seeking to expand their knowledge on thin film analysis. The course covers basic principles and practical aspects of X-ray reflectometry as well as higher skills to analyze details. To help you to get the best possible result out of your analysis, emphasis is placed on selecting the most appropriate hardware and data collection strategies to match your sample. Our newly released Advanced Materials Analsis Software Suite (AMASS) will be used to analyze the reflectivity curves and diffraction space maps collected. Simulation of various example structures will be explained and their nature attuned to the interest of the course participants. Grazing incidence small angle x-ray scattering (GISAXS) will also be discussed as a complimentary technique.

As a participant you are encouraged to bring with you one or two of your characteristic samples (together with the corresponding safety data sheet).

The main aspects covered during the course are the following:
• Basic principles of X-ray Reflectometry
• Hardware components and their impact on data quality
• Practical aspects of sample alignment procedure and data collection
• Extracting information from reflectivity curves:
o Layer thicknesses
o Density
o RMS surface and interface roughness
• Interface morphology from diffuse scattering
• Extracting information from reciprocal space maps:
o Lateral coherence information
o Vertical coherence information
o Bragg peaks
• GISAXS analysis of film morphology

Small-Angle X-ray Scattering (SAXS) analysis using EasySAXS

Basics and practical applications of SAXS on Empyrean or X’Pert3 Powder and X'Pert PRO MPD. Covers sample preparation, instrument setup, data collection and data analysis.

The course is intended for both new and existing users of the Empyrean and X’Pert3 Powder (X’Pert Pro MPD) diffractometers. For the new users the full advantage of this course will be gathered if the SAXS course is followed after the X-Ray Powder Diffraction course. The topics ranges from an introduction to the SAXS technique, to the instrument configuration, as well as practical sessions covering sample preparation, data collection and data analysis using the EasySAXS software. The main purpose of this course is to help you to solve your analytical problem in the most effective way. This course will include hands-on time with our Empyrean NANO platform.

As a participant you are encouraged to bring with you one or two of your characteristic samples (together with the corresponding safety data sheet).

Course content
During the course the following aspects will be covered, both in interactive lectures and in practical sessions:
• Introduction to the SAXS technique
• Instrument setup
• Sample preparation
• Data collection strategies
• Data analysis with EasySAXS software

Pair Distribution Function (PDF) analysis using HighScore Plus

The course is intended for both new and existing users of Empyrean and X’Pert3 Powder (X’Pert Pro MPD) diffractometers. For the new users of Malvern Panalytical XRD systems, the full advantage of this course will be gained if the PDF course is taken after the X-Ray Powder Diffraction course.

The main purpose of the course is to provide you with the basic knowledge of the theoretical aspects of PDF analysis and their practical realization on Empyrean or X’Pert3 Powder (Pro MPD) system.

Measurement strategies and possible instrument geometries will be discussed. The hands-on part will be focused on the sample preparation and on the data collection with the fast GaliPIX3D detector, as well as on the data treatment using HighScore Plus software.

Course content
In the duration of the course the following aspects will be discussed:
• Fundamental aspect of PDF technique
• Measurement strategies, possible instrument setups
• Optimal choice of optical components
• Sample preparation
• Data collection with the fast GaliPIX3D detector
• Data treatment and calculation of the PDF
• Analysis of the PDF

Epitaxial thin film analysis using AMASS

This course is intended for users seeking to expand their knowledge on thin film analysis of single crystal thin films. The course covers basic principles and practical aspects of high resolution x-ray diffraction, including tips for optimization of sample positioning and data collection. The various options available on Empyrean, X’Pert3 MRD (XL) and X’Pert Pro MRD (XL) systems will be discussed, including the use of area detectors for sub-minute reciprocal space map data collection. Our newly released Advanced Materials Analsis Software Suite (AMASS) will be used to analyze the 1D rocking curve/ coupled scans and 2D reciprocal space maps. The new simulation capabilities of AMASS will be explored, as well as configuration of automated analysis using 1D and 2D diffraction data.

As a participant you are encouraged to bring with you one or two of your characteristic samples (together with the corresponding safety data sheet).

The main aspects covered during the course are the following:
• Basic principles of High Resolution X-Ray Diffraction (HR-XRD)
• Hardware components and their impact on data quality
• Practical aspects of sample alignment procedure and data collection
o Optimized sample alignment strategies
o Coupled scans and rocking curves
o Reciprocal space map (RSM) data collection, including ultrafast (sub-minute) RSM’s
• Data analysis using AMASS
o Data manipulation and graphical options
o Analysis based on relative peak positions in 1 and 2D scan
o Simulation and fitting of coupled scans
o Wafer mapping using 1D and 2D scan data
o Automated analysis and reporting options

Complimentary Breakfast and Lunch

These are paid courses
Regular $800 Per day and Academic $400 per day