This 2-day course covers the advanced use of the Zetium XRF spectrometer equipped with the Small Spot Mapping (SSM) option in combination with the SuperQ software. The course is fully dedicated to the analysis of samples using the SSM option. This includes applications making use of standards as well Omnian standardless analysis.
The course is composed of hands-on sessions carried out online using spectrometers in our Application Competence Center, Almelo, The Netherlands.
In depth training on SSM applications:
• Parameter selection
• Qualitative and Quantitative analysis
• Application Setup
This is a paid course. The course fee includes hotel accommodation, lunches and transport from the hotel to our facility. Please contact your local Malvern Panalytical representative for pricing information, travel and accommodation enquiries.
Registration closing date: February 3 2020
- Measurement type:
- Elemental analysis
- March 05 2020 - March 06 2020
09:00 - 15:00
(GMT+01:00) Europe Western
- Malvern Panalytical, Lelyweg 1, Almelo, Netherlands
- Event type:
- Classroom based training
- X-ray Fluorescence (XRF)