This 2-day course covers the advanced use of the Zetium XRF spectrometer equipped with the Small Spot Mapping (SSM) option in combination with the SuperQ software. The course is fully dedicated to the analysis of samples using the SSM option. This includes applications making use of standards as well Omnian standardless analysis.

The course is composed of hands-on sessions carried out online using spectrometers in our Application Competence Center, Almelo, The Netherlands.

In depth training on SSM applications:
• Parameter selection
• Qualitative and Quantitative analysis
• Reporting
• Application Setup

This is a paid course. The course fee includes hotel accommodation, lunches and transport from the hotel to our facility. Please contact your local Malvern Panalytical representative for pricing information, travel and accommodation enquiries.

Registration closing date: February 3 2020

Summary

Measurement type:
Elemental analysis
Date:
March 05 2020 - March 06 2020
Time:
09:00 - 15:00
(GMT+01:00) Europe Western
Country:
Netherlands
Location:
Malvern Panalytical, Lelyweg 1, Almelo, Netherlands
Event type:
Classroom based training
Language:
English
Products:
Zetium
Technology:
X-ray Fluorescence (XRF)