Malvern Panalytical is pleased to offer a remote course for users of Empyrean, X’Pert³ Powder (X’Pert Pro MPD), and Aeris
This course will be an intimate and interactive environment with XRD specialists from Malvern Panalytical. Basic functions of the HighScore software will be discussed, including the HighScore interface, fundamentals of data treatment and phase identification as well as semi-quantitative methods, including amorphous content. Additionally, an overview of X-ray powder diffraction instrumentation and its functionality, sample preparation, and data collection will be discussed. Note that, advanced topics such as Rietveld refinements, crystallite size determination, and line profile analysis will not be discussed in this course.
The course will take place over a one-week period with lectures given on September; Monday 20th, Wednesday 22nd and Friday 24th from 10:00 AM to 5:00 PM. This is designed to allow participants time between lectures to review concepts, work practice examples, familiarize themselves with supplementary material, and come up with questions/issues that may be pertinent to their work.
The course is designed to provide as close to one-on-one training as possible. It is encouraged that participants come with questions unique to their applications and, if possible, example data to be assessed during the course. Because of the intimate and interactive nature of the course seats will be limited. Note that the live sessions will not be available on-demand after the event.
This is a 3-day paid course: Industry $1200 per participant and Academic and Government $600 per participant.
Course registration will close on September 13th or as soon as the class is full. First come, first serve, so don't wait - register early. We reserve the right to cancel courses due to insufficient enrollment or unforeseen circumstances.
- Measurement type:
- Phase identification
- September 20 2021 - September 24 2021
10:00 - 17:00
Eastern Time [US & Canada]
- United States
- Event type:
X'Pert PRO MPD
- X-ray Diffraction (XRD)