In this webinar an overview of X-ray scattering methods will be presented that are commonly applied for the non-destructive characterization of textured and randomly oriented polycrystalline layers. Starting from the basics of the methods the webinar will cover experimental aspects including recent hardware developments followed by the evaluation methods of the data. The applicability of the discussed methods to extract structural information of textured and randomly oriented layered structures will be finally illustrated on selected examples.
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