Date recorded: May 29 2020

Duration: 01 hours 17 minutes 54 seconds

X-ray diffraction (XRD) is the only laboratory technique that reveals structural information, such as chemical composition, crystal structure, crystallite size, strain, preferred orientation and layer thickness. Materials researchers therefore use XRD to analyze a wide range of materials, from powder X-ray diffraction (XRPD) to solids, thin films and nanomaterials.

But what makes a good XRD pattern? How do you know if your peaks have shifted? What if my peaks are broad? What if I am having a high peak to background ratio? This webinar is part of our series of XRD webinars to help you improve your data analysis. In this webinar, our application specialist will discuss:

1. Tips for good quality XRD data collection
2. What makes a good vs bad XRD pattern 
3. How to analyse using Malvern Panalytical’s HighScore Plus software
4. Basic profile fitting options to get accurate peak parameters
5. how to perform phase identification and quantification analysis  


Join our free series of webinars: "Better XRD data analysis and interpretation for materials characterization":
- Webinar 1: Introduction to powder X-ray diffraction. More info
- Webinar 2: Studying battery cathode materials using X-ray diffraction More info
- Webinar 3: Expand your powder XRD applications for materials characterization research. More info
- Webinar 4: Knowing the difference between good and bad data: implications for sampling and collecting good quality data. 
- Webinar 5: Better XRD data quality with good sample preparation. More info 
- Webinar 6: Improving your phase search mapping by defining your elemental range: introduction to elemental analysis using X-ray fluorescence. More info
- Webinar 7: Range of XRD instruments to aid materials characterization research. More info

Table of contents
1. Good quality data requirements
10:49
2. Proper instrument configuration
18:41
3. Data interpretation using HighScore software
11:12
4. Pattern treatment
01:14
5. Background determination
01:06
6. Peak search
03:55
7. Profile fitting
04:58
8. Crystallite size
02:57
9. Single line method
00:25
10. Multiple peak profile: Williamson-Hall plot
01:04
11. Peak labelling
00:42
12. Other treatment options
04:56
13. XRD software and diffractometers
01:47
14. Q & A
14:08