(This webinar will be conducted in Mandarin)

Is Mo the new Ag? Which X-ray source is optimal for my sample type? Which detector should I use for highly fluorescent data? My sample is organic and translucent. Should I continue to operate in reflection or transmission mode? There are so many considerations to consider when running an XRD experiment. In this webinar series, we focus on helping you how to achieve the best quality PXRD results based on the most optimal optical configuration set up.

Malvern Panalytical’s XRD application specialist, Plex Lee, will share about the optimized optical configuration required when working with these scenarios

1. Everyday routine PXRD samples

2. Organic and translucent samples

3. Highly fluorescent materials

4. Hard radiation for battery packs

5. High throughput data analysis

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更精確的XRD定量結果 - 最佳化您的量測設定及光學配置: 獲得更精確的XRD定量分析結果
量測設定和光學配置的優化

我的樣品含鐵/鈷,背景值很高該怎麼辦?應該使用哪種偵測器來測量高螢光樣品的數據?我對於封裝完成的電池充放電反應有興趣,哪種X光源最適合我的樣品類型?該選鉬靶還是銀靶呢?我的樣品是有機和低原子序的,我應該繼續使用一般的反射式量測嗎?進行 XRD 實驗時有許多需要考慮的因素。

在與專家對談系列研討會中,Malvern Panalytical 的XRD應用專家李秉中博士Plex Lee將分享遇到這些情形時所需的最佳化量測配置。

1. 一般常見的粉末樣品

2. 有機和低原子序樣品

3. 高螢光材料(如鐵/鈷)

4. 適合封裝電池組的X光源

5. 大量樣品量測數據分析

Summary

Measurement type:
Phase quantification
Date:
December 02 2021 - December 02 2021
Time:
11:00 - 12:00
Taipei Time [Taiwan]
Event type:
Webinar - Live
Language:
English
Products:
Empyrean range
Technology:
X-ray Diffraction (XRD)

Agenda

計劃議程

XRD應用專家李秉中博士Plex Lee將分享遇到這些情形時所需的最佳化量測配置。

1. 一般常見的粉末樣品

2. 有機和低原子序樣品

3. 高螢光材料(如鐵/鈷)

4. 適合封裝電池組的X光源

5. 大量樣品量測數據分析

Speakers

Dr Plex Lee (李秉中), Applications Engineer at Malvern Panalytical, Taiwan

Dr. Plex Lee joins the Taiwan team as an applications engineer. Dr Lee has a PhD in Engineering and System Science. His expertise is on nano science, thin-film analysis, thermoelectric material, PLD and low temperature physics research. He has multiple years of experience in providing experimental consultancy and data analysis guidance using X-ray diffraction and X-ray fluorescence to numerous research realms. These include quantum-material, superconductor, magnetic thin film, nano-bio materials and more. Dr Lee has conducted research using powder, thin film, single crystal X-ray diffraction and is well versed in Rietveld refinement, elemental composition analysis, grain size and residual stress research. Prior to joining Malvern Panalytical, he worked in the Institute of Physics at Academia Sinica for close to 13 years. He took on various roles as an X-ray analysis laboratory manager and postdoctoral fellow.

李秉中博士近日以應用專家的身分加入Malvern Panalytical X光分析團隊,李博士擁有工程與系統科學博士學位,主要研究領域為奈米科學,薄膜分析,熱電材料以及低溫物理相關主題.他在X光材料分析領域也擁有多年經驗,包含X光繞射分析以及X光螢光分析.在中研院物理所擔任博士後研究以及X光實驗室主任期間,對於各研究團隊所需X光材料分析多有著墨,材料的型態涵蓋粉末,薄膜,單晶繞射以及Rietveld結構精算分析,而領域則含括量子材料,超導材料,磁性薄膜,奈米生物材料等.

FAQ

誰該參加?

- 從事材料表徵分析的研究人員,希望擴展在X光繞射上的知識

- 相關行業包括(但不限於)電池、粉末冶金、水泥、採礦和礦產、環境監測、製藥等領域的研究

- 負責選擇最佳的分析方法的研發或製造的主管們

More information

加入我們基於 XRD 應用程序和數據分析相關網絡研討會的免費系列:

  • X光粉末繞射技術導論 線上研討會:更好的XRD數據分析和判讀. 點擊這裡
  • 更好的XRD數據量測 - 樣品製備技巧: 好的樣品製備技巧讓您的XRD數據分析事半功倍. 點擊這裡
  • 更快的XRD數據分析 - HighScore Plus 實用功能介紹: 更智慧、更直觀、更快速的 XRD 數據分析. 點擊這裡
  • 更精確的XRD定量結果 - 最佳化您的量測設定及光學配置: 獲得更精確的XRD定量分析結果