Orthogonal and complementary nanoparticle characterization techniques

How can I trust my data? Is it affected in any way by the measurement technology, or  by the user through sample preparation or the analysis parameters employed? Independent and orthogonal measurement modalities should be used to provide measurement validation. Two such complementary technologies are Nanoparticle Tracking Analysis and Dynamic Light Scattering and here we will describe both technologies and the complementary data which they produce as well as discuss how their unique capabilities, when used in conjunction, provide the most comprehensive suite of measurement parameters available to those interested in characterization of nanoscale materials.


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