Analyzing specular and off-specular X-ray scattering data
Reflectivity is Malvern Panalytical’s software package for displaying, simulating and fitting X-ray reflectometry data and for analyzing off-specular (diffuse) scattering data of arbitrary multi-layer structures. Layer thickness, density and roughness of thin-layered samples are easily and quickly quantified.
The features of the software make reflectometry, formerly the preserve of highly professional researchers, available to routine users.
- Segmented fitting – similar to the automatic fitting procedure in Epitaxy and Smoothfit
- Genetic algorithm fitting – introduces automatically random modifications of selected parameters, which are tested for a best fit
- Combined genetic algorithm and segmented fitting – generates a first approximation of parameters of low confidence using the genetic algorithm and then automatically refines these with segmented fitting
For each parameter of a given sample model the change in fit values calculated for incremental changes of that parameter. The result of the error analysis is a measure of the reliability range of the parameter.
Analysis of off-specular scattering data
Off-specular (diffuse) scattering data (omega, 2theta and offset omega/2theta scans) can be displayed and simulated. The software simulates coplanar Qx, Qz reciprocal space maps.
The interface roughness model of your choice
Three choices for the interface roughness model are available: fractal, staircase and castellation. An extensive materials database is included for use in simulation and fitting. It contains materials data, such as elemental atomic numbers and masses, as well as their mass absorption and anomalous dispersion coefficients for different X-ray wavelengths. The database is extendable through the addition of new materials and values for other wavelengths.
Version 14, running on all versions of Microsoft Windows from XP to Windows 10.
Operating system: Windows 7 Professional (64-bit) operating system.
Processor: 2 GHz (or faster) 32-bit (x86) or 64-bit (x64)
Internal memory: 1 Gbyte (2-4 Gbytes for simultaneous analysis of many scans as in screening experiments).
Free hard disk space: 10 Gbytes (or more), depending on the amount of data and on the reference database(s) to be installed.
Monitor: Super VGA monitor (17 inch or more) with a desktop area of 1024*768 pixel or more.
The minimum configurations for the supported operating systems are:
Windows XP Professional edition (32-bit)
Windows 7 Professional (64 bit) operating system.
Reflectivity version 1.3a supports data in the XRDML format as well as the old Philips formats (*.dnn and *.xnn) but also allows the import and export of ASCII files.