The BTS 150 and BTS 500 benchtop heating stages are designed for basic in situ X-ray diffraction on powder samples at low to medium-high temperatures for the study of crystal structure changes, phase transformations, chemical reactions, etc. with both organic and inorganic materials. Furthermore basic thin film analysis (phase composition, basic reflectometry) and basic residual stress measurements on relatively thin samples can also be done with these chambers. 

Main features, specifications and application examples are summarized in the brochure.

Automatic analysis of large amounts of X-ray diffraction data with HighScore Plus

Application Note

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