In addition to physical characteristics such as particle size and shape, the chemical identity of particulates can be important for a number of applications such as;

  • Component specific particle characterization for particle mixtures e.g. inhaled pharmaceutical medicines.
  • Identification of contaminant or outlier particles in production samples.
  • Forensic investigation of unknown particulate samples.

Malvern Panalytical have developed advanced instrumentation for the chemical identification of particulate samples combining the high resolution size and shape information from automated imaging with the high chemical specificity of Raman spectroscopy.

Morphologi range

Morphologi range

Automated imaging for advanced particle characterization

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Measurement Particle shape, Particle size
Particle size range 0.5µm - 1300µm
Technology Image analysis
Dispersion type Wet, Dry

ASD LabSpec range

ASD LabSpec range

Laboratory Instrumentation for Qualitative and Quantitative Materials Analysis

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Measurement Molecular structure, Contaminant detection and analysis, Moisture content
Accuracy Spectral performance
Technology Near-infrared Spectroscopy (NIR)

ASD QualitySpec range

ASD QualitySpec range

Quality Control Tools for Industrial Applications

More details
Measurement Molecular structure, Moisture content
Accuracy Spectral performance
Technology Near-infrared Spectroscopy (NIR)

CNA range

CNA range

Online elemental analyzers for effective control of many industrial processes

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Measurement Chemical identification, Elemental analysis, Contaminant detection and analysis, Elemental quantification
Accuracy 1% (non-condensing)
Technology Pulsed Fast Thermal Neutron Activation (PFTNA)

2830 ZT

2830 ZT

Advanced semiconductor thin film metrology solution

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Measurement Chemical identification, Thin film metrology, Elemental analysis, Contaminant detection and analysis, Elemental quantification
Elemental range Be-U
Resolution (Mn-Ka) 35eV
Sample throughput up to 25 wafers per hour
LLD 0.1 ppm - 100%
Technology X-ray Fluorescence (XRF), Wavelength Dispersive X-ray Fluorescence (WDXRF)

Morphologi range

Morphologi range

Automated imaging for advanced particle characterization

ASD LabSpec range

ASD LabSpec range

Laboratory Instrumentation for Qualitative and Quantitative Materials Analysis

ASD QualitySpec range

ASD QualitySpec range

Quality Control Tools for Industrial Applications

CNA range

CNA range

Online elemental analyzers for effective control of many industrial processes

2830 ZT

2830 ZT

Advanced semiconductor thin film metrology solution

More details More details More details More details More details
Measurement Particle shape, Particle size Molecular structure, Contaminant detection and analysis, Moisture content Molecular structure, Moisture content Chemical identification, Elemental analysis, Contaminant detection and analysis, Elemental quantification Chemical identification, Thin film metrology, Elemental analysis, Contaminant detection and analysis, Elemental quantification
Particle size range 0.5µm - 1300µm        
Accuracy   Spectral performance Spectral performance 1% (non-condensing)  
Elemental range         Be-U
Resolution (Mn-Ka)         35eV
Sample throughput         up to 25 wafers per hour
LLD         0.1 ppm - 100%
Technology Image analysis Near-infrared Spectroscopy (NIR) Near-infrared Spectroscopy (NIR) Pulsed Fast Thermal Neutron Activation (PFTNA) X-ray Fluorescence (XRF), Wavelength Dispersive X-ray Fluorescence (WDXRF)
Dispersion type Wet, Dry        

Morphologi 4-ID

ASD LabSpec range

ASD QualitySpec range

CNA range

2830 ZT

Morphologi 4-ID ASD LabSpec range ASD QualitySpec range CNA range 2830 ZT

Rapid, automated, component-specific particle characterization in a single, integrated platform

Laboratory Instrumentation for Qualitative and Quantitative Materials Analysis

Quality Control Tools for Industrial Applications

Online elemental analyzers for effective control of many industrial processes

Advanced semiconductor thin film metrology solution

More details More details More details More details More details
Technology
Image analysis
Near-infrared Spectroscopy (NIR)
Pulsed Fast Thermal Neutron Activation (PFTNA)
Wavelength Dispersive X-ray Fluorescence (WDXRF)