This webinar will focus on the X-ray diffraction (XRD) techniques applied in studying highly oriented (textured) thin film samples. Textured layers are often more challenging to analyze than polycrystalline or epitaxial thin films. For example, when the Perry method is used in the grazing incidence configuration, the uncertainty of residual stress determination can be rather large. This is mainly due to the fact that only a limited number of diffraction peaks can be measured in this configuration. In this webinar several practical examples (ZnO and PZT layers) will be presented and the possibilities to improve the accuracy in both data collection and analysis will be discussed.
Other characterization techniques such as X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GIXRD) and texture determination will be covered as well. The corresponding instrument configurations and methods for data analysis will be illustrated. 

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