Setting meaningful and realistic specifications for pharmaceutical product Critical Material Attributes (CMAs) is important in ensuring a product meets its target performance profile and is safe. Within this, control of elemental impurities is vital as these do not provide therapeutic benefit to the patient and may even cause an adverse effect.
This webinar series will consider the requirements for elemental analysis for pharmaceutical intermediates and final dosage forms using X-Ray Fluorescence (XRF).
In this second seminar, we will work through a live demonstration of the Epsilon 4 benchtop XRF system, providing you with the opportunity to ask any questions you have about the analysis workflow. During the demonstration we will talk about the requirements for XRF system calibration, sample preparation, sample measurement, and analysis. Our goal will be to show how XRF offers a simple, robust alternative to existing methods for elemental analysis such as ICP-OES, ICP-MS and AAS.
Michel Zoontjes - Product Manager Elemental Analysis Division
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- Who should attend?
- Those developing methods for elemental analysis, for example using ICP, AAS or XRF.
- Those developing pharmaceutical formulations
- Those producing or setting specifications for pharmaceutical raw materials or intermediates
- Why attend?
- To learn about how elemental analysis is achieved using XRF for pharmaceutical products.
- Understand how the workflow for XRF analysis compares to techniques such as ICP and AAS and the value it can deliver to your laboratory.