See the finest details in XRD data with 1Der, our newest XRD detector (Asian Pacific timezone)

Living in a modern digital environment, our life and work is based on the completeness of information, and the more we see the more we understand. X-ray diffraction helps non-destructively reveal the identity and quantity of materials. With the introduction by PANalytical, in 2003, of the first laboratory 1D detector, the XRD data collection time has been reduced more than 100 times from hours to minutes while significantly increasing the throughput of the sample measurements or data counting statistics.

However, speed is just one of the factors that can influence the XRD data quality. Another important factor is the peak-to-background ratio which could be negatively affected by fluorescent materials. For example, with a Cu X-ray tube, the fluorescence produced by the Fe, Co elements in a mineral can cause an elevated background that covers the minor phase diffraction peaks therefore leading to an inaccurate quantification results. Classically, the use of a diffracted beam monochromator can resolve this challenge.

However, this solution reduces diffraction intensity and therefore require a longer measurement time. In order to resolve the speed vs. data quality dilemma for all elements and aiming to bring the best product to every user, we introduce a new addition to the Empyrean platform. Our new 1Der XRD detector is designed to take versatility and data clarity to the next level. In this webinar, we will use some examples to demonstrate the unprecedented performance and diffraction details of the 1Der detector, that can now be realized on the Empyrean multipurpose XRD system. We will see:

1.Data from multiple X-ray sources covering a range of today’s cutting-edge applications.
2. How to reduce the background when the fluorescent photon energy of the measured sample (containing Cu or Ni elements) is very close to the Cu-Kα photon’s characteristic energy of ~ 8.04 keV?
3.How a simple functional switch is allowing us to see the monochromatic peaks without the influence of the Cu-Kα2 peaks.

Présentateur

Dr Bao ZhaoHui(鲍朝辉), Senior X-ray Diffraction, Applications Specialist at Malvern Panalytical

Dr Bao has been working at Malvern Panalytical's supply center in the Netherlands for more than 7 years. His specialty is in X-ray diffraction, which can be to uniquely identify and quantify materials based on their crystal structure or to check for phase changes or the integrity or performance of the material under pressure, temperature, humidity changes. ZhaoHui completed his PhD in Materials Science at the Instiut National Polytechnice de Grenoble, France. He carried out his PhD fellowship at the European Commission in Germany where he focused on developing and characterising epitaxial oxide thin films. Today, Dr Bao shares his knowledge with clients who want to expand their research or industrial applications using XRD. This is through guest speaking at conferences and online seminars as well as product demonstrations.

Pour en savoir plus

Who should attend?
All XRD users working on powder and polycrystalline materials,
geologists, mining, chemists, metal engineers, academia researchers, those working within the cement industry and or the food and pharmaceuticals space.