In this study the improved performance of PX10 relative to LiF200 is shown by comparing the measured sensitivities, calculated detection limits and decreased measurement times for the K-lines of elements between potassium and cerium.

For low-level trace element analysis by wavelength dispersive XRF (WDXRF), it is essential to maximize the analyte peak to background ratio and maintain a high spectral resolution to minimize line overlap issues. The most commonly used dispersion or analyzing crystal for the analysis of elements from potassium to uranium is the LiF200 crystal. 

Connexion

Pas encore inscrit?

Sign up for free today. By registering you will have free access to exclusive content including

  • Webinars, presentations and videos
  • Application notes, technical notes, articles, white papers and software downloads

And in addition you will receive

  • Our regular eNews including the latest news, education, events and offers from Malvern Panalytical