In this study the improved performance of PX10 relative to LiF200 is shown by comparing the measured sensitivities, calculated detection limits and decreased measurement times for the K-lines of elements between potassium and cerium.
For low-level trace element analysis by wavelength dispersive XRF (WDXRF), it is essential to maximize the analyte peak to background ratio and maintain a high spectral resolution to minimize line overlap issues. The most commonly used dispersion or analyzing crystal for the analysis of elements from potassium to uranium is the LiF200 crystal.
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