For advanced studies of thin films and solids at high-temperature conditions

DHS 1100 is a heating attachment designed for advanced thin film applications (phase identification, reflectometry, high-resolution XRD) and advanced residual stress and texture measurements on thin films or bulk samples. 

Thanks to the compact design of DHS 1100 and optimized integration on Empyrean and X’Pert³ MRD diffractometers reliable sample positioning is easy and straightforward. An optional powder sample holder can be mounted on the heater plate for powder X-ray diffraction in reflection geometry.