Empyrean
각종 분석 수요에 대응하는 다목적 솔루션
- 측정
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Crystal structure determination
3D structure / imaging
Contaminant detection and analysis
Epitaxy analysis
Interface roughness
Texture analysis
Phase identification
Reciprocal space analysis
Phase quantification
Residual stress
- Goniometer configuration
- Vertical goniometer, Θ-Θ
- 기술 유형
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X-ray Diffraction (XRD)