Зафиксированная дата: July 09 2015

Duration: 43 minutes 0 seconds

In situ X-ray diffraction (XRD) is a well-established and commonly used tool to characterize the change of material properties caused by environmental change (temperature, pressure, gas atmosphere, et cetera). However, XRD has its limitations and sometimes other analytical techniques are required for better understanding of a sample behavior at non-ambient conditions. In this webinar a number of application examples featuring in situ small-angle X-ray scattering (SAXS) and total X-ray scattering (for pair distribution function analysis, PDF) experiments performed on PANalytical’s diffractometers will be discussed.