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Aeris

The future is compact

  • Highly accurate benchtop XRD system
  • Precise results in under five minutes
  • 0D, 1D and 2D detector options
  • Flexible measurement configurations

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Overview

Prepare to be surprised by our highly accurate, fast XRD system: Aeris. Precise results can be ready in less than five minutes. Such rapid acquisition of high-quality data has only been previously achieved by large, floorstanding xrd systems. The compact Aeris is small, powerful, and the first of its kind. 

Take the one-step sample loading in combination with its controlled user access and the option to design data collection programs offline, the result is a practical and versatile system for all users, from beginners to experts.   

No matter where your application falls on the spectrum between versatility and specialization, Aeris can support you.  

Om_logo.png   Works with OmniTrust: Malvern Panalytical's compliance solution for the regulated environment

Aeris XRD for pharma

Solid form analysis for pharmaceutical development and production
Aeris XRD for pharma

Features

Future-proof 

As a modern, multi-purpose* diffractometer, Aeris’ modular design makes optional upgrades and additions a breeze – and guaranteed product availability means peace of mind for the future. 

*Non-ambient, reflection, transmission, grazing incidence, 2D diffraction.

Plug-and-play simplicity

With Aeris, not every user needs XRD expertise.

Its intuitive interface, pre-loaded measurement programs, and easy sample placement make reproducible great results accessible to all.

Easy, reproducible sample loading

Aeris’ precision-built sample holders and external loading system make it easy for all users to load samples correctly every time – for every sample type, from powders to solids. 

Compatibility with regulated environments

With controlled user access and compliance software, Aeris is ready for all regulated workflows (according to 21 CFR Part 11 regulation). 

Multiple users are easily managed.

Fast and accurate

With its classic goniometer and onboard computer, Aeris’ high-performance components and precision sample stages deliver accurate results in as few as five minutes. 

Aeris: The future is compact

Great value to purchase, fast and easy to use, fantastic data; it's a winner!

Damian G. Research

Specification

Sample Handling

Sample loading External sample loading
Variety of full-sized sample holders capable meeting all requirements
Sample changing
Choose between a manual loading dock, 6-position sample changer, or 67-position high-capacity sample changer
Automation
Compatible with automation integration

X-Ray generation

Wavelength
Cu / Co
From 300 W to 600 W options in 30 kV or 40 kV setting
Patented design with Corrosion-resistant incident smart beam path technology (CRISP)
CRISP technology prevents corrosion in the incident beam path caused by X-ray induced ionized air. Patent no. US 8437451 B2

Goniometer

Base configuration
Vertical goniometer, coupled and decoupled θ-θ, samples always horizontal
Bragg-Brentano, Transmission, Grazing Incidence
145 mm
-4° < 2θ ≤ 142° (with scanning detector and full active length)
Direct optical position sensing (DOPS3) with lifetime positioning accuracy
Max 2.17°/s
Resolution
< 0.04° 2θ on LaB6 (with 0.01 rad Soller slits)
< 0.04° 2θ
0.001 °

Stages and detectors

Choice of spinner stages
Heating stage option (BTS-500, BTS-150)
Alignment-free PreFIX exchange of stages
On request (manual, MPSS, In-Situ)
Detector
Choose between the PIXcel1D, PIXcel3D and 1Der detectors

General

Dimensions
690 x 770 x 786 mm
Closed system with external sample loading
Not needed
Not needed
Power Supply
100 – 240 V, single phase
Computer
Internal instrument PC
Operation
Intuitive user interface with 10.4” touch screen
Interface LAN, USB, HDMI

Accessories

Detectors

1Der

Ultimate versatility and data clarity in 1D detection

The 1Der is the latest edition to a portfolio of leading solid-state detectors for X-ray diffraction (XRD) applications. Together with an unrivaled suite of optical configurations, the 1Der integrates seamlessly into the XRD platforms to combine ease of use with ultimate flexibility and data clarity for all 0D and 1D applications.

The 1Der is compatible with all X-ray sources that are used on the Empyrean and Aeris.

PIXcel1D

Medipix technology as a dedicated strip detector

With the PIXcel1D detector you have a dedicated strip detector for 0D and 1D applications. You can measure up to 255 times faster than with a traditional point detector, without compromising data quality. With no need for cooling water, liquid nitrogen flow, counting gas or time-consuming calibrations it is a cost-effective solution.

With an unrivalled resolution and dynamic range, the PIXcel1D can be used with all of our diffractometers.

PIXcel3D

The first detector to bring 0D-1D-2D and 3D data to your diffractometer

The PIXcel3D is a unique 2D solid-state hybrid pixel detector. Each pixel is 55 microns x 55 microns and the detector array is 256 x 256 pixels. The detector, now based on Medipix3 technology, brings unrivalled signal to noise with its point spread function of one pixel and multiple energy discrimination levels.

Sample handling

Aeris combines easy external sample handling with clear, simple, push-button operation, and gives you a full range of upgradeable handling options to place your sample on its external sample platform. The modular build enables you to scale up or down as your needs evolve, including the throughput of your laboratory. Our sample handling options serve a range of requirements, from manual sample loading with a single position to automatic loading of multiple positions in high-throughput environments. Aeris is also designed to fully integrate into your own automated sample laboratory. Sample holders are easily and precisely handled via external positioning stations and can be changed without disturbing ongoing measurements.

Manual sample loading

For users with low sample volumes or infrequent sample changes, the external sample platform allows you to load and replace a single sample while still taking advantage of the automated transfer into the XRD measurement area for accurate sample handling, each and every time.

Manual sample loading

6-position sample changer

The 6-position sample changer enables batch processing of 6 samples at a time, increasing efficiency and reducing the frequency of operator intervention. Ideal for medium-throughput laboratories.

6-position sample changer

High-capacity sample changer

For high-throughput environments, look no further than the Aeris High-Capacity Sample Changer. Its proven robotic sample handling technology enables unattended analysis of over 60 samples, delivering 50% better resource efficiency.

More information
High-capacity sample changer

Automated sample handling

Full integration into multi-system automated labs where the Aeris instrument is operated through UAI interface. Samples are provided to the instrument either with belt automation connected to our automatable changer or with robotic handling, where a robot arm places samples directly on the changer platform.

Automated sample handling

Software solutions

Aeris instruments and measurements are run by its onboard data collection software with preloaded measurement programs. Users can also write their own programs. 

For phase quantification, amorphous content and more, the onboard RoboRiet software can perform automated analysis providing immediate on-screen viewing and transfer to results databases. 

Measurement and analysis can also be automated via X’Pert Industry. Industry offers a unique scripting facility to customize data collection and calibration-line based quantification methods for any process control application. Result reporting is fully configurable also for LIMS systems. 

Alternatively, you can perform your own in-depth analyses using our software packages, HighScore Plus or Stress Plus. 

For regulatory compliance and data integrity, Omnitrust covers your user management and data audit requirements in a regulated environment.

RoboRiet

A special ‘execution-only’ implementation of the Rietveld method and profile fits for XRD phase quantification, amorphous quantification and more. 

More information
RoboRiet

Industry

Software for routine X-ray diffraction analysis in an industrial environment, ranging from non-regulated to fully regulated, and from manually controlled to completely automated systems.

More information
Industry

HighScore Plus

After identification of all phases present in your sample, this all-in-one software suite continues to support your analysis from quantification with or without the Rietveld method to profile fitting and pattern treatment.

More information
HighScore Plus

Stress Plus

Stress Plus software is dedicated to the X-ray diffraction (XRD) analysis of residual stress in polycrystalline coatings. The software performs sin²ψ residual stress analysis using both single-directional and multi-directional techniques. 

More information
Stress Plus

Expertise editions

Aeris makes it easy to characterise and analyze any sample across both research and industrial environments. But sometimes, your application needs a specialist solution – or you need your alternative to a benchtop xrd system to be calibrated and ready for action.

To meet this need, industry-specific, tailored editions of Aeris are also available out-of-the-box. These specialized industry versions come with customizable expertise packages, pre-calibrated for your specific analytical methods or sample material. Your Aeris will be prepared for automated measurement and analysis using the built-in Roboriet software. Ready when you are! 

Find your edition below:

Aeris XRD for pharma

Solid form analysis for pharmaceutical development and production
Aeris XRD for pharma

User manuals

Software downloads

23 June 2025

1.7a

OmniTrust software update v1.7a

1.7a

20 July 2023

1.60

OmniAccess   

  • Flexible/configurable roles in Empyrean and Aeris (now aligns with Zetasizer) 
  • Summary of roles/permissions 
  • Default roles for instrument applications 
  • Support for complex domains 
  • Wizard for initial set up and massively improved UI to improve configuration/set up 

OmniTrail  

  • Record Audit trail events viewable in OmniTrail. 
  • Show/compare authorization files 

More information can be found in the Release and Installation Notes.

1.60

16 December 2021

1.40

OmniAccess   

  • Flexible/configurable roles in Empyrean and Aeris (now aligns with Zetasizer) 
  • Summary of roles/permissions 
  • Default roles for instrument applications 
  • Support for complex domains 
  • Wizard for initial set up and massively improved UI to improve configuration/set up 

OmniTrail  

  • Record Audit trail events viewable in OmniTrail. 
  • Show/compare authorization files 

More information can be found in the Release and Installation Notes.

1.40

Support

Services

Solutions to maximize the return on your investment

To assure that your instrument remains in top condition and performs on the highest level, Malvern Panalytical offers a wide range of services. Our expertise and support services assure an optimal functioning of your instrument.

Support

Service for a lifetime

  • Phone and remote support
  • Preventive maintenance and checkups
  • Flexible Customer Care Agreements
  • Performance certificates
  • Hardware and software upgrades
  • Local and global support

Expertise

Adding value to your processes 

  • Sample preparation development/optimization
  • Analytical methodologies 
  • Turnkey solutions for XRD 
  • Operations via IQ/OQ/PQ, quality assurance (GLP, ISO17025) or round robins/inter laboratory studies
  • Consultancy services

Training and education

  • Training on-site or at our competence centers
  • Broad range of basic and advanced courses on products, applications and software
A small footprint with a BIG impact.

A small footprint with a BIG impact.

Fast high quality XRD, tailored for your requirements. Ready for automation and integration. The modern compact.

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