Enhance cement quality and process control with fast, reliable Aeris XRD analysis. Learn more
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The Cement edition of Aeris directly probes the mineralogical composition of cement and its intermediates. This mineralogical information allows you to judge the physical properties to better control the kiln - for example, when using alternative fuels.
It additionally facilitates the quality assurance of (blended) cements. The Cement edition of Aeris is an easy-to-use and automatable benchtop X-ray diffractometer for every cement plant.
Strength, setting properties, hydration properties and chemical resistance of cement are directly linked to the cement mineralogy. X-ray diffraction is the method for a direct probing of these minerals in cement, allowing better prediction of the physical properties of the final product already in the production phase and facilitating a more efficient and greener production process.
The Aeris Cement edition is your partner at every stage of the cement production process, from raw meal, clinker and (blended) cement to the final product.
Rapid analysis minimizes feedback loops and allows early intervention for process optimization. Standard analysis time for clinker or cement is just 5 minutes.
Uptime of the analytical equipment is key for reliable process control. From the ground up, Aeris has been designed for maximum uptime.
The most intuitive X-ray diffractometer: with a built-in touch screen your results are always just a few taps away.
| Sample loading | External sample loading |
|---|---|
| Sample holders | Variety of full-sized sample holders capable meeting all requirements |
| Sample changing | Choose between a manual loading dock, 6-position sample changer, or 67-position high-capacity sample changer |
| Automation | Compatible with automation integration |
| Wavelength | Cu |
|---|---|
| Tube setting | From 300 W to 600 W options in 30 kV or 40 kV setting |
| Tube housing | Patented design with Corrosion-resistant incident smart beam path technology (CRISP)
CRISP technology prevents corrosion in the incident beam path caused by X-ray induced ionized air. Patent no. US 8437451 B2 |
| Base configuration | Vertical goniometer, coupled and decoupled θ-θ, samples always horizontal |
|---|---|
| Geometry | Bragg-Brentano, Transmission, Grazing Incidence |
| Radius | 145 mm |
| Maximum 2θ range | -4° < 2θ ≤ 142° (with scanning detector and full active length) |
| Angle positioning | Direct optical position sensing (DOPS3) with lifetime positioning accuracy |
| Scan Speed | Max 2.17°/s |
| Resolution | < 0.04° 2θ on LaB6 (with 0.01 rad Soller slits) |
| 2θ linearity | < 0.04° 2θ |
| Smallest addressable increment | 0.001 ° |
| Spinning | Choice of spinner stages |
|---|---|
| Non-ambient | Heating stage option (BTS-500, BTS-150) |
| Exchange of stages | Alignment-free PreFIX exchange of stages |
| Special stages | On request (manual, MPSS, In-Situ) |
| Detector | Choose between the PIXcel1D, PIXcel3D and 1Der detectors |
| Dimensions | 690 x 770 x 786 mm |
|---|---|
| Dust protection | Closed system with external sample loading |
| External cooling water supply | Not needed |
| Compressed air supply | Not needed |
| Power Supply | 100 – 240 V, single phase |
| Computer | Internal instrument PC |
| Operation | Intuitive user interface with 10.4” touch screen |
| Interface | LAN, USB, HDMI |
The 1Der is the latest edition to a portfolio of leading solid-state detectors for X-ray diffraction (XRD) applications. Together with an unrivaled suite of optical configurations, the 1Der integrates seamlessly into the XRD platforms to combine ease of use with ultimate flexibility and data clarity for all 0D and 1D applications.
The 1Der is compatible with all X-ray sources that are used on the Empyrean and Aeris.
With the PIXcel1D detector you have a dedicated strip detector for 0D and 1D applications. You can measure up to 255 times faster than with a traditional point detector, without compromising data quality. With no need for cooling water, liquid nitrogen flow, counting gas or time-consuming calibrations it is a cost-effective solution.
With an unrivalled resolution and dynamic range, the PIXcel1D can be used with all of our diffractometers.
Whether you are interested in improved process control, or doing research and development, understanding your materials starts very often with understanding the powder diffraction pattern.
While Malvern Panalytical helps you in getting the best powder diffraction pattern with our diffractometers, one of your primary concerns is to identify the contents of your sample. HighScore is the ideal software for phase identification, semi-quantitative phase analysis, pattern treatment, profile fitting and more. The software package contains many supporting functions to display, manipulate and to evaluate your diffraction data. HighScore can handle all Malvern Panalytical XRD data formats and additionally most of the diffraction patterns from other suppliers.
Whether you are interested in improved process control, or doing research and development, understanding your materials starts very often with understanding the powder diffraction pattern.
After identification of all phases present in your sample with Malvern Panalytical’s HighScore, this all-in-one software suite with the Plus option continues to support you with your analysis. Whether your focus is on quantification with or without the Rietveld method, profile fitting, or pattern treatment; HighScore Plus is the solution and helps you performing your daily analyses.
We are proud to showcase tutorial videos made by our customer, JIAM Diffraction Facility from the University of Tennessee, USA. Scroll below for more videos.
Phase identification by X-ray diffraction means comparing unknown measured data with known reference data. This reference data is usually taken from one or several databases. The comparison process is often called search-match as well.
The quality and the contents of the different reference databases vary considerably, depending on the data quality and on the editorial process. Generally speaking there is a relation between price and quality.
For high-throughput environments, look no further than the Aeris High-Capacity Sample Changer. Its proven robotic sample handling technology enables unattended analysis of over 60 samples, delivering 50% better resource efficiency.
More information
Full integration into multi-system automated labs where the Aeris instrument is operated through UAI interface. Samples are provided to the instrument either with belt automation connected to our automatable changer or with robotic handling, where a robot arm places samples directly on the changer platform.
The 6-position sample changer enables batch processing of 6 samples at a time, increasing efficiency and reducing the frequency of operator intervention. Ideal for medium-throughput laboratories.
For users with low sample volumes or infrequent sample changes, the external sample platform allows you to load and replace a single sample while still taking advantage of the automated transfer into the XRD measurement area for accurate sample handling, each and every time.
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OmniTrust software update v1.7a
OmniAccess
OmniTrail
More information can be found in the Release and Installation Notes.
OmniAccess
OmniTrail
More information can be found in the Release and Installation Notes.
To assure that your instrument remains in top condition and performs on the highest level, Malvern Panalytical offers a wide range of services. Our expertise and support services assure an optimal functioning of your instrument.
Service for a lifetime
Adding value to your processes
Fast high quality XRD, tailored for the Cement industry. Ready for automation and integration. The modern compact.
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