Epsilon 4

Fast and accurate at-line elemental analysis

  • Multi-functional benchtop XRF analyzer 
  • Elemental analysis from fluorine (F) to americium (Am) in areas from R
  • Industry-tailored editions and software

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Overview

Built on the experience and success of the proven Epsilon 3 range of XRF spectrometers, the Epsilon 4 is a multi-functional benchtop XRF analyzer for any industry segment needing elemental analysis from fluorine (F) to americium (Am) in areas from R&D through to process control. 

Combining the latest excitation and detection technologies with mature software and smart design, the analytical performance of Epsilon 4 approaches that of more powerful and floor-standing XRF spectrometers.

Industry editions

Features

  • Flexible configurations: Epsilon 4 is a highly flexible analytical tool available in a 10-Watt version for elemental analysis (F – Am) in areas from R&D through to process control. For even higher sample throughput or extended light-element capabilities and in more challenging environments, a 15-Watt version is available, which can even analyze carbon, nitrogen and oxygen.

  • Latest developments: Epsilon 4 instruments combine the latest excitation and detection technologies with state-of-the-art analysis software. The 15-Watt X-ray tube in combination with the high current (3 mA), latest silicon drift detector SDD30 together with the compact design of the optical path, deliver even better analytical performance than 50-Watt power EDXRF and even benchtop WDXRF systems - with the added bonus of power efficiency.

  • Fast and sensitive: Fast measurements are achieved by using the latest silicon drift detector technology that produces significantly higher intensities. Unique detector electronics enable a linear count rate capacity to over 1,500,000 cps (at 50% dead time) and a count rate independent resolution typically better than 135 eV for better separation of analytical lines in the spectrum. This allows the Epsilon 4 spectrometer to run at full power and therefore realizes a much higher sample throughput compared to traditional EDXRF benchtop instruments.

  • Reduce helium consumption: The high performance of Epsilon 4 enables many applications to be operated in air atmosphere, without longer overhead time and costs involved for helium or maintenance of the vacuum system. When measuring in air, low-energy X-ray photons characteristic of sodium, magnesium and aluminum are sensitive to variations in air pressure and temperature. Built-in temperature and air-pressure sensors compensate for these environmental variations, ensuring excellent results whatever the weather.

Universal and reliable device.

Jakub Nowak — ComerLab Dorota Nowak

Specification

Sample handling

Sample capacity 10-position removable sample changer
Sample size Spectrometer can accommodate samples up to 52 mm (2 inch) in diameter
Features Spinner is included for better accuracy of air filter analysis
Large sample mode for analyzing bigger samples up to 10 cm in height

X-ray tube

Features Metal-ceramic side window for maximum stability
50 micrometers thin beryllium window for high sensitivity for light elements (Na, Mg, Al, Si)
Tube setting Ag anode X-ray tube for best performance of P, S and Cl analysis

Detector

Detector type High-resolution silicon drift detector (SDD), typically 135 eV @ Mn-Kα
Features Max count rate of 1,500,000 counts/s at 50% dead time
Thin-entrance detector window for high sensitivity

Software

Software
  • Elemental screening with Omnian standardless analysis solution
  • PASS/FAIL analysis with FingerPrint solution
  • Enhanced Data Security for regulated environments
  • Stratos for multi-layered samples
  • One flexible calibration for wear metals in fresh and used lubricating oils using Oil-Trace

Accessories

Software

Epsilon software

Analytical EDXRF software package for Epsilon benchtop systems

Epsilon software is the XRF analysis software platform that is used with PANalytical’s range of Epsilon 1 and Epsilon 4 benchtop EDXRF systems. The software offers all the functions required to set up and operate an Epsilon benchtop system. The analytical program assembly is greatly facilitated by the high degree of intelligence built into the software, allowing users to benefit from half a century of applications expertise. Daily XRF analysis is a routine task that can be readily carried out by inexperienced personnel after a minimum of instruction. Many features are present to enhance the usability of the software.

Stratos

Determination of composition and thickness of coatings and multi-layers

The Stratos software module features an algorithm which enables simultaneous determination of chemical composition and thickness of layered materials from measurements taken. The software provides a rapid, simple and non-destructive means of analyzing coatings, surface layers and multi-layered structures. The Virtual Analyst provides intelligence during the setup of measurement programs for complicated stacks. 


Available for both the Epsilon 4 EDXRF and Zetium XRF spectrometers, Stratos delivers fast and reliable results regardless of sample type or matrix.

Omnian

Standardless analysis of all types of samples

Omnian enables users to achieve the best possible analysis when dedicated methods or certified standards do not exist. A trendsetting standardless analysis package, Omnian incorporates state-of-the-art software and setup samples that transcend technologies. Available for Epsilon 1, Epsilon 4 and Zetium spectrometers, Omnian delivers fast and reliable results regardless of sample type or matrix.

Oil-Trace

Accurate trace element analysis

Oil-Trace is a software package consisting of a suite of standards which enables users to perform accurate and reliable elemental analysis of liquids using WDXRF and EDXRF. Oil-Trace solves two problems when analyzing liquids:

1) Adequate matrix correction in the presence of an unknown mix of CHON elements

2) Correcting for errors due to variations in the volume of the sample being analyzed

By effectively tackling these problems, Oil-Trace brings significant benefits to petroleum analysis.

FingerPrint

Instant material identification

A FingerPrint software module combined with an Epsilon 4 EDXRF system is ideal for material testing when analysis speed is important but the actual composition is not of interest. FingerPrinting generally involves little to no sample preparation and is non-destructive.

Enhanced Data Security

Securing your data and satisfying auditors

The Enhanced Data Security (EDS) module is a software option that provides enhanced trust in results for users of the Zetium XRF spectrometer (through the SuperQ software) and the Epsilon XRF spectrometer. With capabilities including advanced user management, action logging, data protection, and application status assignment, EDS helps you strengthen your audit trail, minimize the risk of error, and prove that your XRF instrument is working as expected.

Standards (Reference materials)

ADPOL

Accurate and trustworthy XRF elemental composition of your polymers, compounds and plastics, obtained in minutes. 

More information

WROXI

Accurate wide-range oxide analysis of minerals

WROXI CRM is a synthetic, high-quality Certified Reference Materials kit that covers a wide range of oxide materials such as ores, rocks, and geological materials.

More information

LAS: Low Alloy Steel

Low alloy steel analysis with Malvern Panalytical XRF spectrometers.

Low Alloy Steel (LAS) package for the sequential and simultaneous XRF spectrometers Zetium and Axios FAST, is based on >90 CRMs covering up to 21 elements, and 4 monitor samples for drift- and sample preparation correction.

More information

RoHS

Accurate elemental analysis of RoHS restricted materials.

The RoHS calibration module helps manufacturers and research laboratories comply with the requirements of RoHS 2 legislation. Accurate elemental analysis using RoHS Calibration Standards can save you money and support compliance with international regulations like REACH.

More information

TOXEL

Accurate analysis by XRF of toxic elements in polymers and plastics

The TOXEL module enables easy and accurate elemental analysis of toxic elements in polyolefins, including many kinds of PP and PE.

More information

CRMs

Certified reference materials, including XRF calibration modules and reference materials

More information

Sample preparation

Claisse LeNeo

Keeping ahead through Claisse expertise in fusion.

Claisse LeNeo fusion instrument prepares glass disks for XRF as well as borate and peroxide solutions for AA analysis and ICP analysis. LeNeo is a single-position electrical instrument.

More information
Claisse LeNeo

Why Epsilon 4?

Epsilon 4 Anywhere

Due to its low infrastructural requirements, Epsilon 4 can be placed next to the production line anywhere in your process. 

Its high performance enables most applications to be operated at ambient conditions, reducing costs for helium or vacuum maintenance.

Value beyond analysis

Energy dispersive X-ray fluorescence spectrometer for the elemental analysis range from carbon (C) to americium (Am) and the concentration range from sub-ppm to 100 wt%. 

Use Omnian for standardless analysis, use FingerPrint for material testing when analysis speed is important or use Stratos for a rapid, simple and non-destructive analysis of coatings, surface layers and multi-layered structures. 

Users can also use Enhanced Data Security which supports compliance with regulations like FDA 21 CFR Part 11 or use Oil-Trace for quantifying fuel-biofuel mixtures to fresh and used lubricating oils.

Ready for any sample type

The Epsilon 4 handles a wide variety of sample types, including solids, pressed and loose powders, liquids and filters. It performs non-destructive quantitative analysis of elements from carbon (C) fluorine to americium (Am), in concentrations from 100% down to sub-ppm levels, on samples weighing anything from a few milligrams to kilograms.

The Epsilon 4 is a robust and reliable alternative to conventional systems for a wide variety of industries and applications, even when light element analysis is of outmost importance, including: cement production, mining, mineral beneficiation, iron, steel and non-ferrous metals, RoHS screening and quantification, petroleum and petrochemicals, polymers and related industries, glass production, forensics, pharmaceuticals, healthcare products, environmental, food and cosmetics.

Universal and reliable device.

Jakub Nowak — ComerLab Dorota Nowak

User manuals

Software downloads

Please contact support for the latest software version.

Support

Solutions to maximize the return on your investment

To assure that your instrument remains in top condition and performs on the highest level, Malvern Panalytical offers a wide range of services. Our expertise and support services assure an optimal functioning of your instrument.

Support

Service for a lifetime

  • Phone and remote support
  • Preventive maintenance and checkups
  • Flexible Customer Care Agreements
  • Performance certificates
  • Hardware and software upgrades
  • Local and global support

Expertise

Adding value to your processes 

  • Sample preparation development/optimization
  • Analytical methodologies 
  • Turnkey solutions for XRD 
  • Operations via IQ/OQ/PQ, quality assurance (GLP, ISO17025) or round robins/inter laboratory studies
  • Consultancy services

Training and education

  • Training on-site or at our competence centers
  • Broad range of basic and advanced courses on products, applications and software
Powerful at-line elemental analysis.

Powerful at-line elemental analysis.

The latest technology for XRF analysis. Pre-calibrated for your industry. Ready for fast quantification right next to your production line.

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