Better XRD data analysis starting with good sample preparation methods (Mandarin language)

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(This webinar will be conducted in Mandarin)

更好的XRD數據量測 - 樣品製備技巧: 好的樣品製備技巧讓您的XRD數據分析事半功倍 與專家對談系列研討會

X光繞射儀 (XRD) 是一項可揭示原子排列資訊的強大實驗室技術,因此材料研究人員大量使用 XRD 分析各種材料,從粉末繞射到塊材、薄膜和奈米材料的物理特性,包含化學組成、晶體結構、晶粒大小、殘餘應力、優選晶向和薄膜厚度等皆可經由XRD相關實驗來獲得。

精確的XRD 實驗數據在我們發表研究成果時是非常重要的。但是,如何才能得到精確的XRD數據呢?除了需要足夠的繞射強度外,合適的晶粒尺寸以及均勻的空間分布則貢獻了正確的繞射峰相對強度。


在此次網路研討會中,Malvern Panalytical XRD應用專家李秉中博士Plex Lee將分享如何藉由正確的樣品製備技巧讓您的XRD數據分析事半功倍:

1. 理想的粉末顆粒大小

2. 如何讓樣品分布更均勻分佈

3. 研發過程中只能取得微量樣品,該怎麼辦?

4. 根據特定樣品類型選擇使用合適的樣品載台

5. 獲得最佳樣品製備方法的實用小技巧

加入我們基於 XRD 應用程序和數據分析相關網絡研討會的免費系列:

  • X光粉末繞射技術導論 線上研討會:更好的XRD數據分析和判讀. 點擊這裡
  • 更好的XRD數據量測 - 樣品製備技巧: 好的樣品製備技巧讓您的XRD數據分析事半功倍
  • 更快的XRD數據分析 - HighScore Plus 實用功能介紹: 更智慧、更直觀、更快速的 XRD 數據分析. 點擊這裡
  • 更精確的XRD定量結果 - 最佳化您的量測設定及光學配置: 獲得更精確的XRD定量分析結果. 點擊這裡


X-ray diffraction (XRD) is the only laboratory technique that reveals structural information, such as chemical composition, crystal structure, crystallite size, strain, preferred orientation and layer thickness. Materials researchers therefore use XRD to analyze a wide range of materials, from powder X-ray diffraction (XRPD) to solids, thin films and nanomaterials.

When publishing our research, it is so important to publish high quality XRD data. But what makes superior XRD data? Apart from needing sufficient diffraction intensity, your sample needs to have total randomness of crystallite orientations and a sufficient amount of crystallites. This will ensure that you have a good representation of the intensity distribution of the sample.

Now that we’ve covered what makes good quality data, it is key to know that the way in which the sample is prepared can cause errors. For instance, overgrinding can cause peak broadening. Under-grinding can result in insufficient crystallites and hence leading to poor signal to noise ratios.

In this webinar, Malvern Panalytical XRD application specialist, Plex Lee will share about good sample preparation tips for high quality XRD data:

1. How to grind and what’s the ideal particle size

2. How to apply an even distribution of your sample

3. What to do if you have a limited quantity of sample

4. What sample holder to use depending on your sample type

5. And other practical tips on how to obtain best sample preparation methods

what makes a good XRD pattern? How do you know if your peaks have shifted? What if my peaks are broad? What if I am having a high peak to background ratio? This webinar is part of our series of XRD webinars to help you improve your data analysis. In this webinar, our application specialist will discuss:

1. Tips for good quality XRD data collection

2. What makes a good vs bad XRD pattern

3. How to analyse using Malvern Panalytical’s HighScore Plus software

4. Basic profile fitting options to get accurate peak parameters

5. how to perform phase identification and quantification analysis


Dr Plex Lee (李秉中), Applications Engineer at Malvern Panalytical, Taiwan

Dr. Plex Lee joins the Taiwan team as an applications engineer. Dr Lee has a PhD in Engineering and System Science. His expertise is on nano science, thin-film analysis, thermoelectric material, PLD and low temperature physics research. He has multiple years of experience in providing experimental consultancy and data analysis guidance using X-ray diffraction and X-ray fluorescence to numerous research realms. These include quantum-material, superconductor, magnetic thin film, nano-bio materials and more. Dr Lee has conducted research using powder, thin film, single crystal X-ray diffraction and is well versed in Rietveld refinement, elemental composition analysis, grain size and residual stress research. Prior to joining Malvern Panalytical, he worked in the Institute of Physics at Academia Sinica for close to 13 years. He took on various roles as an X-ray analysis laboratory manager and postdoctoral fellow.

李秉中博士近日以應用專家的身分加入Malvern Panalytical X光分析團隊,李博士擁有工程與系統科學博士學位,主要研究領域為奈米科學,薄膜分析,熱電材料以及低溫物理相關主題.他在X光材料分析領域也擁有多年經驗,包含X光繞射分析以及X光螢光分析.在中研院物理所擔任博士後研究以及X光實驗室主任期間,對於各研究團隊所需X光材料分析多有著墨,材料的型態涵蓋粉末,薄膜,單晶繞射以及Rietveld結構精算分析,而領域則含括量子材料,超導材料,磁性薄膜,奈米生物材料等.

Perguntas mais frequentes


- 從事材料表徵分析的研究人員,希望擴展在X光繞射上的知識

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- 負責選擇最佳的分析方法的研發或製造的主管們