Compound semiconductor functionality is all about the layer structure. But unlike a cake, it’s rare that you wish to slice up your wafer to see what is going on inside. Fortunately, though, in this instance you can turn to metrology technologies, such as X-ray diffractometry (XRD), to generate accurate and precise structural metrology in a non-destructive manner. Here, advanced capabilities ...
- Produtos:
- X'Pert3 MRD (XL), X'Pert3 MRD
- Tecnologia:
- X-ray Diffraction (XRD)
- Setor:
- Semicondutores, Materiais eletrônicos/ópticos