One size doesn’t fit all: Choosing the right particle sizing technique

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Particle size analysis is critical across industries - but not all techniques are created equal.

In this first session of our new webinar series, we lay the foundation for understanding the relationship between particle size and surface area by focusing on the core techniques used to measure particle size. We’ll provide a comprehensive overview of the most widely used particle sizing methods, including laser diffraction, sedimentation, image analysis (dynamic and static), dynamic light scattering (DLS), nanoparticle tracking analysis (NTA), air permeability, and small-angle X-ray scattering (SAXS).

Learn how each technique works, what it measures, and when it’s best applied - so you can make informed decisions based on your sample type, size range, and application needs.

Palestrante

  • Anne Virden - Product Manager – Micro Materials, Malvern Panalytical
  • Jack Saad - Lab Manager, Micromeritics

Mais informações

Who should attend? 

This webinar is ideal for:

  • Scientists and engineers working in materials science, pharmaceuticals, chemicals, mining, and food industries
  • Lab managers and analysts responsible for particle characterization
  • R&D professionals exploring new formulations or materials
  • Anyone evaluating particle sizing technologies for purchase or implementation

What will you learn? 

By the end of this webinar, attendees will be able to:

  • Understand the principles behind key particle sizing techniques
  • Compare strengths, limitations, and typical applications of each method
  • Identify the most suitable technique(s) for different sample types and industry needs
  • Gain practical tips for optimizing measurement accuracy and efficiency
  • Make confident decisions when selecting instrumentation for particle size analysis

'Understanding Particle Characterization: From Size to Surface' Series

This webinar is part of our series: Understanding Particle Characterization: From Size to Surface.

Stay tuned for registration details for the upcoming sessions in this series: