With the new edition of the data collector software large reciprocal space maps can be measured with PIXcel3D detector within tens of seconds. This option, combined with the functionality of the domed heating and cooling stages (DHS 1100 and DCS 350), enables in situ monitoring of temperature effects on the epitaxial layers in real time.
In this application note, the results of the X-ray analysis on the thermal stability of an AlInN/AlN/GaN heterostructure is demonstrated. By using a PIXcel3D detector, reciprocal space maps (RSM) were rapidly measured while annealing the sample at 600˚C. The timeresolved data allowed to monitor the degradation process and its kinetics.
Inicio de sesión
¿Aún no está registrado?
Sign up for free today. By registering you will have free access to exclusive content including
- Webinars, presentations and videos
- Application notes, technical notes, articles, white papers and software downloads
And in addition you will receive
- Our regular eNews including the latest news, education, events and offers from Malvern Panalytical