A comparison of sieves and laser diffraction for particle size analysis

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00:00:00 Welcome
00:00:13 Introduction
00:01:40 A comparison of sieves and laser diffraction for particle size analysis
00:02:44 Abstract
00:03:33 Outline
00:04:25 They’re not the same are they?
00:06:37 Sieves – factors that play a role
00:08:01 Diffraction – factors that play a role
00:09:00 Grizzly Isle of Mull January 1999
00:09:47 All retained particles are considered the same (> 1”)
00:10:54 Sieves
00:11:51 Sieves
00:11:56 Why laser diffraction?
00:14:30 Laser diffraction – what are we measuring?
00:15:25 Measurement principle
00:16:52 Untitled
00:16:57 Halo around moon http://apod.nasa.gov/apod/ap030421.html
00:17:33 Size of droplets
00:18:52 Laser diffraction - disadvantages?
00:18:57 Variation of scattering angle with particle size
00:20:14 Iteration - the fit
00:21:11 Shape and laser diffraction
00:23:23 Laser diffraction and screen - resolution
00:25:06 Extremes of distributions
00:26:40 Continuous – discontinuous Sieve display as histogram!
00:27:19 Continuous – discontinuous Laser diffraction display as histogram
00:28:19 x100 – ISO13320:2009
00:28:54 Sieving - a common question
00:29:36 Sieving - a common question – 100 mm cubeSquare mesh screen
00:30:58 This particle will also pass the screen
00:32:12 Sieving – 100 mm cube particle twice the densitySquare mesh screen
00:33:08 Maximum dimension of a unit cube
00:33:31 What will/may a square screen pass?
00:34:13 Sieving - a common question
00:34:44 Sieving – shape dependence
00:35:28 Circular holes?
00:35:50 Sieves: calibration and verification
00:36:50 Cement (from NIST SP260-176)
00:37:30 Laser diffraction: calibration and verification
00:38:42 Cement
00:39:00 Sieves – resolution
00:39:29 Sieves - tolerance
00:41:01 In case you think that this is old and outdated..
00:41:06 NBS-1003cMeasured by sieves, diffraction and EZS
00:42:09 NBS-1003cMeasured by sieves, diffraction and EZS
00:42:23 NBS-1003cSieves – reproducibility - statistics – AFR calculations
00:43:07 NBS-1003cLaser diffraction – reproducibility - statistics – AFR calculations
00:43:41 Comparison of techniques – buyer beware!
00:45:50 Powder coatingFinal sieve set to 100mm2-bar pressure
00:46:15 Powder coatingFinal sieve set to 150mm1.5-bar pressure
00:46:52 Sieves - Ibuprofen
00:47:07 Sieves - Ibuprofen
00:47:33 Sieves - Ibuprofen
00:48:02 Sieving
00:48:29 So where did that quote really originate?
00:49:13 AIME March 1907 No 14
00:50:03 Notoriously inaccurate method
00:50:43 Route forward
00:52:57 Useful references
00:53:03 Past webinar
00:53:28 Thank you!
00:53:46 Thank you for your attentionAny questions?
00:59:37 Contact Information
In this presentation, we explore the practical aspects of sieving method – the advantages and disadvantages. We will also compare the method to other techniques such as laser diffraction indicating the increased wealth of information that can be obtained with these more modern instrumental techniques.


Dr. Alan Rawle has more than a quarter of a century’s experience in various aspects of technology. He started his academic life in industrial chemistry gaining a Ph.D in supported alloy catalysts where colloidal sized material was the norm. After a career in liquid crystal displays engineering he moved onto technology transfer and thence on to electro-optics, lasers, signal processing and ultimately particle sizing characterization techniques. He has spent many years working on the ISO TC24/SC4 (Particles Sizing techniques excluding sieving) committee which has been responsible for such standards as ISO 13320-1 dealing with laser diffraction and ISO 13321 dealing with photon correlation spectroscopy. He is the Convener of WG10, Small Angle X-Ray Scattering Methods. After his move across the pond from the U.K. to the U.S.A., he has also become involved in ASTM activities. He is currently CoChair of E 56.02, the Characterization SubCommittee of the ASTM E56 Committee on Nanotechnology and is also a member of 3 other ASTM committees. He and his team are involved in supporting Malvern Instruments’ customers worldwide.

Pour en savoir plus

Why attend?
To gain an insight into some of the common pitfalls and assumptions of the screening technique, the limited information generated by sieves, and an understanding of the differences when compared to other techniques.

Who should attend?
Anyone who is sadly tasked with having to effect comparisons of screens with other data and is (perhaps) having to bend one set of data to fit another.

What will you learn?
About the differences and potential benefits of laser diffraction compared with sieve analysis and a suggested strategy for peaceful coexistence of both techniques.