날짜 기록: December 18 2019
Duration: 45 minutes 19 seconds
Join us for a demonstration of the New Empyrean 3rd generation X-ray diffractometer. Like no other system available, the Empyrean is designed for now, and for years to come. A fully automated series of 6 samples was demonstrated using several different measurements types, including reflection geometry, SAXS, 2D transmission, texture, residual stress, thin film reflectivity, and grazing incidence XRD.
The Optics enable the analyst a large variety of measurements without manual intervention. The predefined batch function with data collector has the programming power to switch between measurement types seamlessly. The world of materials science is constantly changing and the life of a high performance diffractometer like the Empyrean 3rd generation will deliver results that save time and effort, as well as, ensure accuracy of the experimental set up.