Nanotechnology characterization techniques

Log in to watch this webinar

Not registered yet? Create an account
00:00:00 Untitled
00:01:11 Nanotechnology characterization techniques
00:02:51 Abstract
00:03:16 Obligatory Opening Quotation (O2Q)
00:04:31 Overview
00:07:30 Nano - more roadmaps than Delorme
00:08:22 ANSI-NSP RecommendationsGroup 3
00:09:40 NASA http://www.nasa.gov/pdf/501325main_TA10-Nanotech-DRAFT-Nov2010-A.pdf
00:10:27 Maynard - 2009
00:11:18 FDA – “Regulatory Science and nanotechnology at FDA” Paul C. Howard, Ph.D., Director, Office of Scientific Coordination
00:12:20 After the inaugural meeting of ASTM E56E56.02 Characterization (Rawle/Fritts)
00:13:52 So we’ll focus on….
00:14:01 If you can’t see it, then how can you measure it?Amgen slide from USP 2010 workshop (Narhi, Cao, Jiang) “Different techniques are needed for different size rangesThese also differ in sensitivity”
00:15:45 Number/visualization and volume/mass
00:18:34 Harold Heywood & Brian Scarlett
00:18:43 Heywood (1) & Scarlett
00:19:17 Harold Heywood (2)
00:20:09 NIST RM 8011 (nominally 10 nm Au colloid)
00:21:25 Visualization
00:22:07 Microscopy
00:23:17 Sample preparation – artefacts?
00:23:22 “Sample preparation”
00:25:22 Visualization
00:26:39 Subjectivity
00:27:38 Electron Microscopy
00:27:54 RCA Model EMT3
00:28:15 RCA Model EMT3 http://www.smecc.org/rca_emt_tabletop.htm
00:28:23 Electron Microscopy – affordable?
00:28:46 Electron Microscopy
00:28:57 Early electron micrograph shows the issues…
00:29:41 ASTM ILS #166
00:31:15 Confocal microscopy Minsky US 3013467http://en.wikipedia.org/wiki/Confocal_microscopy
00:31:51 Atomic Force Microscopy (AFM)http://en.wikipedia.org/wiki/Atomic_force_microscopy
00:32:47 RM8013 – ASTM ILS # 166
00:33:25 Dynamic Light Scattering/PCS
00:34:56 Fluctuations of Scattered Light
00:36:04 Intensity fluctuations, correlation and size distributions
00:36:34 ASTM ILS #166 (RM’s 8011/8012/8013)
00:37:09 Small-angle X-ray scattering
00:38:19 Small-Angle X-Ray Scattering (SAXS)
00:39:03 Experimental Setup
00:39:38 Experimental Setup
00:39:59 DLS and SAXS Summary
00:40:21 Interpretation
00:40:52 Note the links between surface area and size
00:42:31 Information domains for (X-Ray) scattering
00:43:00 Fractal dimension from light scattering
00:43:13 Carbon black – before and after sonication
00:43:46 Fractal dimension
00:44:03 Brian Kaye A Random Walk Through Fractal Dimensions VCH (1989) Page 3
00:45:00 Nanoparticle Tracking Analysis (NTA)
00:45:37 Nanoparticle Tracking Analysis (NTA)
00:46:30 DMEM aggregation catalysed by 488nm laser illumination
00:47:37 in action
00:49:01 EU definition of “nano”
00:49:42 The D[1, 0] – number mean - is always just above the bottom limit of the technique….
00:50:40 References
00:51:06 Thank you!
01:00:16 Contact Information
This recorded webinar is an overview of routes utilized for the physical characterization on nanosized materials.