Introduction
With the introduction of Bragg-BrentanoHD, PANalytical again sets a new standard for recording high-speed, high-quality powder diffraction data, with the following key features:
1. Excellent monochromatization of the radiation from the X-ray source, with the following benefits:
- Higher intensities than with the commonly used divergence slits and beta filters
- A smooth, featureless background profile along the full 2θ range without the usual artifacts of the 1D Bragg-Brentano setup, allowing reliable identification of trace phases, and less chance of misinterpretation by inexperienced users
- Improved detection limits, leading to better quantification of trace phases and/ or amorphous components
- Better low-angle performance
- Minimal excitation of fluorescent radiation from the sample
2. Extends the range of applications of the powder diffractometer without the need for additional modules
- Analysis of thin films by grazing incidence diffraction and X-ray reflectivity
- Nanoparticle size, shape, and size distribution analysis by small angle X-ray scattering (SAXS)
- Micro-spot analysis
3. Compatible with all PANalytical’s multipurpose powder diffractometers, both on new systems and already installed ones
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