Discover the next evolution of Aeris compact XRD with the launch of new X-ray Reflectometry (XRR) capability.
In this webinar, we will explore how Aeris continues to make X-ray diffraction accessible, reliable, and easy to use, and how its latest XRR capability opens new possibilities for thin-film and surface analysis.
XRR is widely used to characterize film thickness, density, roughness, and interface quality in coatings, multilayers, and advanced materials. Although often considered a more complex technique, Aeris simplifies the workflow, making reflectometry as approachable as routine powder XRD.
Join us to learn why Aeris is already a powerful platform for everyday XRD, what XRR can reveal about your materials, and how Aeris makes advanced thin-film analysis easier than ever.
Palestrante
- Dr. Gwilherm Nénert - Product Manager, Malvern Panalytical
- Dr. Martin Schreyer - Senior Application Product Specialist, Malvern Panalytical
Mais informações
Who should attend?
- Scientists and researchers working on thin film analysis
- Aeris XRD users wanting to expand their instrument’s capabilities
What will you learn?
- Learn about: The evolution of the Aeris compact XRD platform and its new X-ray Reflectometry (XRR) capability, plus how XRD remains accessible, reliable, and easy to use.
- Discover how: Aeris simplifies XRR workflows, making advanced thin-film and surface analysis, like measuring thickness, density, and roughness, as straightforward as routine powder XRD.
- Understand why: XRR expands analytical possibilities for coatings, multilayers, and advanced materials, enhancing Aeris as a powerful, everyday platform for deeper material insight.