(This webinar isconducted in Mandarin)
The beauty of working in the research and development team is to be able to look into the future and anticipate needs that our end users did not even realize they required before. Malvern Panalytical is proud to announce our latest version of the HighScore Plus software, version 5.1. Ever since its conceptualization, our software developers have made improvements such as automated functionalities for not only more intuitive but faster analysis.
Some of the new features of Malvern Panalytical's HighScore Plus XRD software which enable easy automation and more accurate analysis:
1) “Smart Batches”: Creating an automated analysis is often hampered by a difficult GUI or because the analysis itself is very complicated. HighScore solves this easily by providing a graphical flowchart design and execution interface. See how you can incorporate decision steps as well as any number of feedback loops.
2) ”DDM Method”: Suffered with the preferred orientation in RIR analysis? DDM (the new RIR?) advanced pattern fitting methods can provide quantification of crystalline and amorphous phases. This semi-quantitative data analysis method can satisfy your need without proceeding complicated refinement process.
3) ”RoboRiet”: Want to reduce the loading of the daily routine job of XRD data analysis? RoboRiet gives you the automatic Rietveld refinements and profile fits of XRD phase quantification, amorphous quantification and more for process control to make your life easier.
HighScore Plus 的實際應用和新增功能
有沒有想過數據分析軟體比你自己更知道你需要的是什麼嗎？ Malvern Panalytical最新版的HighScore Plus軟體，版本5.1。自其首次發表以來，我們的軟體開發人員已經進行了許多功能上的改良，並含括全世界上各種不同領域所需的XRD數據分析功能，如自動化分析功能、半定量成分分析等，且相容晶體學開放資料庫(COD)，可提供您更直觀，且更快速的分析結果。
Malvern Panalytical 的 HighScore Plus XRD 軟體的新功能，可使自動化更加簡單，分析更加準確：
- Smart Batch
- DDM Method
Dr Plex Lee (李秉中), Applications Engineer at Malvern Panalytical, Taiwan
Dr. Plex Lee joins the Taiwan team as an applications engineer. Dr Lee has a PhD in Engineering and System Science. His expertise is on nano science, thin-film analysis, thermoelectric material, PLD and low temperature physics research. He has multiple years of experience in providing experimental consultancy and data analysis guidance using X-ray diffraction and X-ray fluorescence to numerous research realms. These include quantum-material, superconductor, magnetic thin film, nano-bio materials and more. Dr Lee has conducted research using powder, thin film, single crystal X-ray diffraction and is well versed in Rietveld refinement, elemental composition analysis, grain size and residual stress research. Prior to joining Malvern Panalytical, he worked in the Institute of Physics at Academia Sinica for close to 13 years. He took on various roles as an X-ray analysis laboratory manager and postdoctoral fellow.
李秉中博士近日以應用專家的身分加入Malvern Panalytical X光分析團隊,李博士擁有工程與系統科學博士學位,主要研究領域為奈米科學,薄膜分析,熱電材料以及低溫物理相關主題.他在X光材料分析領域也擁有多年經驗,包含X光繞射分析以及X光螢光分析.在中研院物理所擔任博士後研究以及X光實驗室主任期間,對於各研究團隊所需X光材料分析多有著墨,材料的型態涵蓋粉末,薄膜,單晶繞射以及Rietveld結構精算分析,而領域則含括量子材料,超導材料,磁性薄膜,奈米生物材料等.
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