Join Product Manager Gwilherm Nénert as he introduces X-ray reflectometry (XRR) on the compact Aeris XRD platform.
XRR enables accurate measurement of thin film layer thickness, surface roughness, and density in a fully non-destructive way. On Aeris, reflectometry is simplified through alignment-free sample holders, making high-quality measurements fast and accessible.
Seamlessly switch between XRR and powder XRD with no downtime, and take advantage of the Aeris sample changer for automated, high-throughput analysis.
presentadores
- Gwilherm Nénert - Product Manager, Malvern Panalytical