Semiconductor thin films. Analysis of III-V solar cells on silicon substrates

The X’Pert3 MRD X-ray diffraction system is a versatile tool for studying residual lattice strain in solar cell structures grown on relaxed buffer layers. Offcut structures in the form of single crystal AlGaAs/GaAs multilayers on GaAs and Ge substrate wafers and on Ge-on-Si pseudo-substrates were analyzed.

The physical properties of a single crystal solar energy collecting device are dependent upon the unit cell and thin film structure of the layers that form the device. During growth, the thin film unit cell is constrained to an in-plane lattice parameter provided by the substrate.


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