| 00:00:00 | Untitled |
| 00:01:11 | Nanotechnology characterization techniques |
| 00:02:51 | Abstract |
| 00:03:16 | Obligatory Opening Quotation (O2Q) |
| 00:04:31 | Overview |
| 00:07:30 | Nano - more roadmaps than Delorme |
| 00:08:22 | ANSI-NSP RecommendationsGroup 3 |
| 00:09:40 | NASA http://www.nasa.gov/pdf/501325main_TA10-Nanotech-DRAFT-Nov2010-A.pdf |
| 00:10:27 | Maynard - 2009 |
| 00:11:18 | FDA – “Regulatory Science and nanotechnology at FDA” Paul C. Howard, Ph.D., Director, Office of Scientific Coordination |
| 00:12:20 | After the inaugural meeting of ASTM E56E56.02 Characterization (Rawle/Fritts) |
| 00:13:52 | So we’ll focus on…. |
| 00:14:01 | If you can’t see it, then how can you measure it?Amgen slide from USP 2010 workshop (Narhi, Cao, Jiang) “Different techniques are needed for different size rangesThese also differ in sensitivity” |
| 00:15:45 | Number/visualization and volume/mass |
| 00:18:34 | Harold Heywood & Brian Scarlett |
| 00:18:43 | Heywood (1) & Scarlett |
| 00:19:17 | Harold Heywood (2) |
| 00:20:09 | NIST RM 8011 (nominally 10 nm Au colloid) |
| 00:21:25 | Visualization |
| 00:22:07 | Microscopy |
| 00:23:17 | Sample preparation – artefacts? |
| 00:23:22 | “Sample preparation” |
| 00:25:22 | Visualization |
| 00:26:39 | Subjectivity |
| 00:27:38 | Electron Microscopy |
| 00:27:54 | RCA Model EMT3 |
| 00:28:15 | RCA Model EMT3 http://www.smecc.org/rca_emt_tabletop.htm |
| 00:28:23 | Electron Microscopy – affordable? |
| 00:28:46 | Electron Microscopy |
| 00:28:57 | Early electron micrograph shows the issues… |
| 00:29:41 | ASTM ILS #166 |
| 00:31:15 | Confocal microscopy Minsky US 3013467http://en.wikipedia.org/wiki/Confocal_microscopy |
| 00:31:51 | Atomic Force Microscopy (AFM)http://en.wikipedia.org/wiki/Atomic_force_microscopy |
| 00:32:47 | RM8013 – ASTM ILS # 166 |
| 00:33:25 | Dynamic Light Scattering/PCS |
| 00:34:56 | Fluctuations of Scattered Light |
| 00:36:04 | Intensity fluctuations, correlation and size distributions |
| 00:36:34 | ASTM ILS #166 (RM’s 8011/8012/8013) |
| 00:37:09 | Small-angle X-ray scattering |
| 00:38:19 | Small-Angle X-Ray Scattering (SAXS) |
| 00:39:03 | Experimental Setup |
| 00:39:38 | Experimental Setup |
| 00:39:59 | DLS and SAXS Summary |
| 00:40:21 | Interpretation |
| 00:40:52 | Note the links between surface area and size |
| 00:42:31 | Information domains for (X-Ray) scattering |
| 00:43:00 | Fractal dimension from light scattering |
| 00:43:13 | Carbon black – before and after sonication |
| 00:43:46 | Fractal dimension |
| 00:44:03 | Brian Kaye A Random Walk Through Fractal Dimensions VCH (1989) Page 3 |
| 00:45:00 | Nanoparticle Tracking Analysis (NTA) |
| 00:45:37 | Nanoparticle Tracking Analysis (NTA) |
| 00:46:30 | DMEM aggregation catalysed by 488nm laser illumination |
| 00:47:37 | in action |
| 00:49:01 | EU definition of “nano” |
| 00:49:42 | The D[1, 0] – number mean - is always just above the bottom limit of the technique…. |
| 00:50:40 | References |
| 00:51:06 | Thank you! |
| 01:00:16 | Contact Information |
This recorded webinar is an overview of routes utilized for the physical characterization on nanosized materials.