Reflection topography with PIXcel3D

X-ray topography (XRT) is a nondestructive imaging technique based on Bragg diffraction. It is an imaging technique that visualizes the intensity profile of a beam diffracted by a bulk crystal. Since the intensity distribution recorded in a topograph is caused by the diffraction contrast, the topograph reflects the spatial distribution of
the scattering power of one selected reflection of a crystal. Irregularities in the crystal lattice are revealed by intensity modulations. XRT is sensitive to various kinds of macroscopic defects.

Topographic images reveal irregularities in a non-ideal crystal lattice by means of diffraction contrast. Using the unique 2D performance of the PIXcel3D a setup was realized that allows to collect XRTs of bulk single crystals with very high quality in a very short time. 


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