Practical small spot analysis and element mapping

Ideal for detailed characterization of materials in research and process control

The latest advances in integrating XRF technology enable bulk analysis together with small spot analysis and element mapping on a single platform. The ability to analyze small areas, or map the distribution of elements on a fine scale, widens the range of applications possible for fundamental investigations in production control and materials research.

Conventional X-ray fluorescence (XRF) spectrometry is a commonly used analytical method to establish the bulk elemental composition of a wide range of materials in both manufacturing and R&D. It is used for process monitoring and final quality control in a variety of industries, ranging from petrochemicals, mining, building materials to metals. Bulk XRF analysis requires homogeneous samples, and spectrometers configured for this type of analysis are not normally suited to analyze heterogeneities and very small areas of the sample. 


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