Fecha registrada: June 11 2020

Duration: 01 hours 10 minutes 54 seconds

X-ray diffraction is one of the most powerful tools for identifying unknown crystalline phases. And there are various databases that crystallographers can reference against, for instance ICDD. By comparing the positions and intensities of the diffraction peaks against a library of known crystalline materials, the target material can be identified. This action is known as phase search mapping. Because this method of phase search scanning involves the mathematical matching of such scans, it is possible that the phase mathematically matches to the XRD pattern, but not actually be in the sample.

During this webinar, we discuss about such confounding errors where incorrect phases were recognised. And importantly how such errors can be minimized or eliminated by way of narrowing the search mapping by way of understanding the chemistry or elemental composition of the material.

Interested to learn more? 

Join our free series of webinars: "Better XRD data analysis and interpretation for materials characterization":
- Webinar 1: Introduction to powder X-ray diffraction. More info
- Webinar 2: Studying battery cathode materials using X-ray diffraction More info
- Webinar 3: Expand your powder XRD applications for materials characterization research More info
- Webinar 4: Good vs bad XRD patterns: how to improve your phase analysis. More info
- Webinar 5: Better XRD data quality: importance of good sample preparation. More info 
- Webinar 6: Improving your phase search mapping by defining your elemental range: introduction to elemental analysis using X-ray fluorescence. 
- Webinar 7: Live demo at your desk - latest high performing XRD Benchtop. More info
- Webinar 8: XRD phase quantification tutorial - improve your XRD data analysis. More info    
- Webinar 9: XRD data analysis on HighScore Plus version 4.9 - what's new?  More info   
- Webinar 10: Range of XRD instruments to aid materials characterization research. More info

Table of contents
1. XRD phase characterisation & challenges
06:20
2. Elemental analysis: how it complements XRD
03:13
3. Elemental analysis using X-ray fluorescence
06:16
4. XRF for small spot mapping, layer thickness
11:11
5. Phase mapping demo on HighScore Plus software
25:38
6. Q & A
18:16