| 00:00:00 | International standards in particle characterization |
| 00:01:13 | "International standards in particle characterization" |
| 00:02:34 | Abstract |
| 00:03:09 | Overview |
| 00:04:01 | Obligatory Opening Quotation (O2Q) |
| 00:05:14 | Interesting map |
| 00:05:49 | “How Much and How Many”The story of weights and measures |
| 00:06:21 | Jeanne Bendick (1919 – 2014)http://www.theday.com/article/20140403/NWS11/140409834/-1/zip06details&town=Guilford&template=zip06art |
| 00:06:46 | Introduction |
| 00:07:21 | Standards |
| 00:09:04 | ISO TC24/SC4 Particle Characterizationhttp://www.iso.org/iso/standards_development/technical_committees/other_bodies/iso_technical_committee.htm?commid=47176 |
| 00:11:17 | TC24/SC4 – Participating and observing countries |
| 00:11:54 | Leaders of country delegations |
| 00:12:28 | ISO TC24/SC4 – Sub-committees |
| 00:13:29 | TC24/SC4 - overall |
| 00:14:06 | Key TC24/SC4 standards |
| 00:15:15 | Non-specific to technique (WG11 and WG1) |
| 00:15:38 | Imaging (WG8) |
| 00:16:01 | Zeta potential (WG17)(ISO 13099-3 in progress) |
| 00:16:06 | Sedimentation (WG2) |
| 00:16:12 | Particle Counting (WG12) |
| 00:16:32 | Light scattering (WG6 & WG7) |
| 00:17:38 | ISO 13320:2009 Particle size analysis -- Laser diffraction methods |
| 00:18:48 | ISO TC 229 Nanotechnologies http://www.iso.org/iso/iso_technical_committee?commid=381983 |
| 00:20:01 | TC 229 – full ISO standards |
| 00:20:25 | ISO TC229 Structure |
| 00:21:01 | The British influence… |
| 00:21:54 | 80004 series |
| 00:22:03 | ASTM International |
| 00:24:14 | Why ASTM International? |
| 00:24:53 | ASTM: my committees… |
| 00:25:33 | ASTM – Collaboration workspaces |
| 00:26:18 | ILS ASTM News November/December 2009 |
| 00:26:40 | Precision and bias statement |
| 00:27:30 | ASTM E29 Particle and Spray Characterization |
| 00:28:21 | ASTM E29 Committee Scope |
| 00:28:31 | Flyer - 1 |
| 00:28:44 | Flyer - 2 |
| 00:28:52 | ASTM E56 Nanotechnology |
| 00:29:13 | ASTM E56 - Standards |
| 00:29:57 | Work items |
| 00:30:41 | IEC - International Electrotechnical Commission |
| 00:31:06 | OECD - Organization for Economic Co-operation and Development |
| 00:31:51 | Studying materials (BIAC = The Business and Industry Advisory Committee to the OECD) |
| 00:32:26 | CEN - Comité Européen de Normalisation |
| 00:33:22 | IEEE - Institute of Electrical and Electronics Engineers |
| 00:33:28 | Standards (materials manufacturers) |
| 00:34:07 | Reference Material |
| 00:36:27 | Reminder |
| 00:36:52 | QAS – 2 pages (“certified” results and protocols) |
| 00:37:28 | Certified Reference Material |
| 00:37:33 | NBS 1003cMaterial + protocolGlass beads |
| 00:37:42 | NBS1003cMeasured by sieves, diffraction and EZS |
| 00:37:59 | It may be that we need other parameters with secondary methods – e.g. RIOptical propertiesImportant even at 40mm! |
| 00:38:42 | ISO/REMCO |
| 00:39:17 | USP & EP |
| 00:39:59 | JP |
| 00:40:14 | The offspring of ISO 13320-1: 1999 |
| 00:40:45 | Note the relationship of USP with EP |
| 00:40:58 | Standards are child’s play…. |
| 00:41:13 | References |
| 00:42:11 | The ‘old’ BS 3406 series |
| 00:42:59 | BS 3406 – still current |
| 00:43:25 | Blatant advertising - my plenary talk at PSA 2014 |
| 00:43:43 | Previous webinars |
| 00:44:06 | Thank you! |
| 00:44:40 | Contact Information |
We will talk about the large number of international standards (ISO TC24/SC4 and ASTM E29/E56 in particular but also dealing with USP) in particle characterization.