Do you want to collect high-quality X-ray reflectometry data? Good practices that will help

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X-ray reflectometry (XRR) is a well-established analytical method for the characterization of thin layered structures, surfaces and interfaces. It is used to determine layer thicknesses and densities and provides roughness-related information. The basics of XRR and the analysis of XRR data were discussed in one of our webinars last year. This time, the focus will be on a typical workflow, from setting up the X-ray optics of a diffractometer, the essential steps of the sample alignment procedures to the final XRR measurement.
Don’t miss the useful practices and tips that we will share with you in this webinar. They will help you to collect high-quality XRR data from your layered samples.

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Zhaohui Bao is an X-ray diffraction specialist at PANalytical, working specifically with XRD applications and development projects. Before joining PANalytical, Zhaohui did his Ph.D. research on oxide thin films in Karlsruhe, Germany. His main interests lay on high-resolution thin films investigations, small-angle X-ray scattering and general powder applications.