Reduce analysis times by up to 80% for inclusions and elemental mapping

With the unique X-ray optics of HiPer Small Spot Mapping, measurement times can be reduced by up to 80%. This puts the Zetium in a class of its own with respect to analytical power, speed and task flexibility in a wide range of environments.

• Small spot mapping available on your spectrometer for production control
• Inclusion analysis in just minutes or map over 100 mm² in only a few hours
• Cover Na to Am and screen for unexpected elements
• Schedule and run small spot mapping on sample batches