This technical note discusses interpretation of data and results obtained from zeta potential measurements in the ZS Xplorer software for the Zetasizer Advance series of instruments and highlights various parameters and charts that can be used to assess data and result quality.
Table 1 shows a list of recommended parameters that are available in ZS Xplorer software which can be used to aid interpretation of the data and results obtained.
|Zeta potential||The mean zeta potential value in millivolts (mV)|
|Zeta deviation||The standard deviation of the zeta potential distribution in millivolts (mV)|
|Conductivity||The conductivity of the sample determined from the measurement in milli Siemens per centimeter (mS/cm)|
|(Zeta Data) Mean count rate||The mean count from the measurement in kilo counts per second (kcps) at the attenuator selected for the measurement|
|Attenuator||The attenuator position used during the measurement|
|(Zeta Data) Derived Mean Count Rate||The normalized count rate (in kcps) obtained from the mean count rate and the attenuator selected for the measurement|
|Reference beam count rate||The count rate of the reference beam (in kcps). This is set during instrument manufacture to be 2,600 ± 200 kcps|
|Quality factor||A signal to noise-based parameter derived from a phase analysis during the Fast Field Reversal (FFR) stage of the measurement|
|SFR spectral quality factor||A signal to noise-based parameter that is derived from the frequency analysis during the Slow Field Reversal (SFR)stage of the measurement|
|Number of zeta runs||The number of sub runs used in the measurement|
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