SDCOM
Able to measure crystals starting from 1 mm in size, the SDCOM uses the azimuthal scan method to accurately determine the complete lattice orientation of single crystals in just one measuring rotation – taking only a few seconds. Suitable for both research and production quality control, the versatile and accessible SDCOM fits easily into a wide range of wafer and ingot process steps and does not require water cooling.
User manuals
Software downloads
Por favor, póngase en contacto con soporte para la última versión del software.