Date d'enregistrement: April 22 2014

Duration: 47 minutes 56 seconds

We will talk about the large number of international standards (ISO TC24/SC4 and ASTM E29/E56 in particular but also dealing with USP) in particle characterization.
Table of contents
1. International standards in particle characterization
01:13
2. "International standards in particle characterization"
01:21
3. Abstract
00:35
4. Overview
00:52
5. Obligatory Opening Quotation (O2Q)
01:13
6. Interesting map
00:35
7. “How Much and How Many”The story of weights and measures
00:32
8. Jeanne Bendick (1919 – 2014)http://www.theday.com/article/20140403/NWS11/140409834/-1/zip06details&town=Guilford&template=zip06art
00:25
9. Introduction
00:35
10. Standards
01:43
11. ISO TC24/SC4 Particle Characterizationhttp://www.iso.org/iso/standards_development/technical_committees/other_bodies/iso_technical_committee.htm?commid=47176
02:13
12. TC24/SC4 – Participating and observing countries
00:37
13. Leaders of country delegations
00:34
14. ISO TC24/SC4 – Sub-committees
01:01
15. TC24/SC4 - overall
00:37
16. Key TC24/SC4 standards
01:09
17. Non-specific to technique (WG11 and WG1)
00:23
18. Imaging (WG8)
00:23
19. Zeta potential (WG17)(ISO 13099-3 in progress)
00:05
20. Sedimentation (WG2)
00:06
21. Particle Counting (WG12)
00:20
22. Light scattering (WG6 & WG7)
01:06
23. ISO 13320:2009 Particle size analysis -- Laser diffraction methods
01:10
24. ISO TC 229 Nanotechnologies http://www.iso.org/iso/iso_technical_committee?commid=381983
01:13
25. TC 229 – full ISO standards
00:24
26. ISO TC229 Structure
00:36
27. The British influence…
00:53
28. 80004 series
00:09
29. ASTM International
02:11
30. Why ASTM International?
00:39
31. ASTM: my committees…
00:40
32. ASTM – Collaboration workspaces
00:45
33. ILS ASTM News November/December 2009
00:22
34. Precision and bias statement
00:50
35. ASTM E29 Particle and Spray Characterization
00:51
36. ASTM E29 Committee Scope
00:10
37. Flyer - 1
00:13
38. Flyer - 2
00:08
39. ASTM E56 Nanotechnology
00:21
40. ASTM E56 - Standards
00:44
41. Work items
00:44
42. IEC - International Electrotechnical Commission
00:25
43. OECD - Organization for Economic Co-operation and Development
00:45
44. Studying materials (BIAC = The Business and Industry Advisory Committee to the OECD)
00:35
45. CEN - Comité Européen de Normalisation
00:56
46. IEEE - Institute of Electrical and Electronics Engineers
00:06
47. Standards (materials manufacturers)
00:39
48. Reference Material
02:20
49. Reminder
00:25
50. QAS – 2 pages (“certified” results and protocols)
00:36
51. Certified Reference Material
00:05
52. NBS 1003cMaterial + protocolGlass beads
00:09
53. NBS1003cMeasured by sieves, diffraction and EZS
00:17
54. It may be that we need other parameters with secondary methods – e.g. RIOptical propertiesImportant even at 40mm!
00:43
55. ISO/REMCO
00:35
56. USP & EP
00:42
57. JP
00:15
58. The offspring of ISO 13320-1: 1999
00:31
59. Note the relationship of USP with EP
00:13
60. Standards are child’s play….
00:15
61. References
00:58
62. The ‘old’ BS 3406 series
00:48
63. BS 3406 – still current
00:26
64. Blatant advertising - my plenary talk at PSA 2014
00:18
65. Previous webinars
00:23
66. Thank you!
00:34
67. Contact Information
03:16