Collecting X-ray Powder Diffraction Data: how to choose the best configuration and measurement parameters

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00:00:00 Introduction to X-ray powder diffractometry:
00:03:06 Objective
00:04:20 downloads
00:05:14 Common optics for x-ray powder diffraction
00:05:22 Why do we need optics for XRPD?
00:07:25 Why do we need optics for XRPD?
00:10:50 Soller Slits reduce axial divergence
00:13:43 Divergence Slits limit equatorial divergence
00:17:29 Other slits and optics
00:19:06 Why do we need optics for XRPD?
00:20:26 Beta-filter
00:21:34 Monochromator
00:23:25 Incident-beam prefix modules
00:25:53 Incident-beam prefix modules
00:26:54 Detectors
00:27:09 Criteria for accurate xrpd data
00:27:16 Collecting accurate data
00:28:41 Anode type
00:30:29 Anode Type
00:31:03 Anode type
00:31:25 Anode type
00:33:36 Sample fluorescence
00:35:28 Instrument configuration criteria
00:36:47 Instrument configuration criteria
00:37:28 X-ray penetration depth
00:38:36 Video 1
00:38:36 X-ray penetration depth
00:40:05 Instrument configuration
00:41:33 Instrument configuration
00:41:44 Instrument configuration criteria
00:41:54 Instrument configuration criteria
00:42:05 Video 2
00:42:05 Instrument parameters for accurate data
00:42:30 Instrument parameters for accurate data
00:43:18 Instrument parameters for accurate data
00:45:09 Instrument parameters for accurate data
00:46:42 Instrument alignment
00:47:23 Optimizing measurement parameters
00:47:31 Measurement parameters
00:47:43 Program type
00:47:49 Video 3
00:47:49 Scan types (Scan axis)
00:49:41 Measurement parameters
00:50:30 Step size
00:51:58 Step size
00:52:52 Step size
00:54:58 Scan rate
00:58:00 Scan rate
00:59:17 Scan Rate
01:00:02 Scan Rate
01:00:24 Video 4
01:00:24 Scan Rate
01:01:31 Scan repetition
01:03:56 Video 5
01:03:56 Improving crystallite statistics
01:04:53 Improving crystallite statistics
01:05:29 Video 6
01:05:29 Improving crystallite statistics
01:06:39 Concerns and recommendations for various sample types
01:06:55 Want to know more?
01:07:43 Appendix A:illustrated reference guide for Prefix modules
01:07:57 Question & Answer SessionUse the Q & A icon and type your question.If listening on demand send your questions to: events@malvernpanalytical.comThank you for attending

X-ray Powder Diffractometers are versatile instruments that often come with a variety of optics and accessories that can be exchanged to optimize measurements. While these options provide flexibility, they can also leave one unsure about the best configuration to use. This presentation will teach ways to navigate all of the choices and select the best configuration and measurement parameters to collect powder diffraction data from a variety of samples.

This presentation will:

  • review the common optics used for X-ray powder diffraction and discuss their impact on data quality;
  • discuss how configuration affects resolution, intensity, beam size, etc;
  • identify the most critical criteria for collecting accurate data;
  • discuss how different sample types (clinker, mining, chemical, pharmaceutical, advanced materials) place different requirements on measurements;
  • discuss strategies for optimizing measurement parameters.


Scott Speakman, XRD Principal Scientist at Malvern Panalytical


Why attend?
Attendees will leave with practical knowledge on selecting the optimal instrument set up to obtain the best data for a certain type of sample.

What will you learn?
XRD system components and their purposes and affects on the quality of data. Strategies for best setups for given sample types. As a bonus they will be able to download a chart from the presenter that makes setting up experiments for different samples effortless.