See the current Empyrean range of multipurpose x-ray diffractometers. Find out more

Empyrean 銳影系列

多功能 X 光繞射儀

Empyrean 銳影系列

Malvern Panalytical 以 Empyrean 為 X 光分析樹立全新標準。

這款模組化多功能平台將 X 光繞射 (XRD)、散射、成像，以及現在加入的 X 光吸收光譜技術 (XAS) 結合於單一儀器，讓您不必只依賴同步輻射設施，也能對材料取得更深入的見解。

Empyrean 專為現代材料研究不斷演變的需求而設計，可隨著您的應用需求成長而調整，提供足以因應當前挑戰與未來問題的靈活性。

联系应用支持

支持的产品

测量: Crystal structure determination
3D structure / imaging
Contaminant detection and analysis
Epitaxy analysis
Interface roughness
Texture analysis
Phase identification
Reciprocal space analysis
Phase quantification
Residual stress

Goniometer configuration: Vertical goniometer, Θ-Θ

Particle size range: 1 - 100 nm

技術類型: X-ray Diffraction (XRD)

Empyrean

测量: 3D structure / imaging
Crystal structure determination
Phase identification
Phase quantification

Goniometer configuration: Vertical goniometer, Θ-Θ

技術類型: X-ray Diffraction (XRD)

Empyrean 锐影 Alpha 1

测量: Molecular weight
Particle shape
Particle size
Phase identification
Phase quantification
Pore size distribution
Protein aggregation
Protein stability
Surface area

Goniometer configuration: Vertical goniometer, Θ-Θ

Particle size range: 1 - 100 nm

技術類型: X-ray Diffraction (XRD)
X-ray Scattering

Empyrean Nano 版

测量: Crystal structure determination
3D structure / imaging
Contaminant detection and analysis
Epitaxy analysis
Interface roughness
Texture analysis
Phase identification
Phase quantification
Reciprocal space analysis
Residual stress

技術類型: X-ray Diffraction (XRD)

Empyrean XAS