Empyrean 銳影系列

测量

Crystal structure determination
3D structure / imaging
Contaminant detection and analysis
Epitaxy analysis
Interface roughness
Texture analysis
Phase identification
Reciprocal space analysis
Phase quantification
Residual stress

Goniometer configuration

Vertical goniometer, Θ-Θ

Particle size range

1 - 100 nm

技術類型

X-ray Diffraction (XRD)

测量

3D structure / imaging
Crystal structure determination
Phase identification
Phase quantification

Goniometer configuration

Vertical goniometer, Θ-Θ

技術類型

X-ray Diffraction (XRD)

测量

Molecular weight
Particle shape
Particle size
Phase identification
Phase quantification
Pore size distribution
Protein aggregation
Protein stability
Surface area

Goniometer configuration

Vertical goniometer, Θ-Θ

Particle size range

1 - 100 nm

技術類型

X-ray Diffraction (XRD)
X-ray Scattering