Analytical solutions for the analysis of metal coatings
As layers of pure metals or alloys are used to enhance certain features of a product, it is important to precisely and accurately determine coating thickness. Quality control of metal coatings requires non-destructive, elemental analysis as well as detailed characterization of physical properties. X-ray fluorescence (XRF), X-ray diffraction (XRD) and particle shape analysis are non-destructive, non-contact analytical techniques that require little or no sample preparation, making them ideal for this application.
Typical applications include:
![]() Morphologi 系列為精密顆粒特性分析而生的自動成像系統 |
![]() Empyrean智慧型 X 光繞射儀 |
![]() Zetium 金属版金属中的新元素 |
![]() Epsilon 系列快速準確的在線 (at-line) 與線上 (on-line) 元素分析 |
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技術類型 | ||||
影像分析 | ||||
X光繞射(XRD) | ||||
波长色散式 X 射线荧光 (WDXRF) | ||||
能量色散式 X 射线荧光 (EDXRF) | ||||
X光螢光 (XRF) |