VIRTUAL 30th ORE AND MINERALS ANALYSIS (OMA) Day 2

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The 30th OMA is a great way to discover the latest advancements in mining and minerals. Catch up with day 2 to find out more about significant production returns with innovative technology and high equipment performance (efficiency).

You can watch day 1 here.

This event gathers industry experts as well as our own experts to discuss exploration, process optimization and tailings management. New advances in elemental analysis (X-ray and neutron analysis), mineralogical analysis (X-ray diffraction and near-infrared (NIR)), on-line analysis (elemental, mineralogical and particle size) and sample preparation will be covered.

Day 2: Get significant production returns with innovative technology and high equipment performance (efficiency)

Time (EDT)Time (CET)SubjectPresenter
11:00 am5:00 pmHigh quality analysis: it starts with high quality standardsChantal Audet, Product Manager, Malvern Panalytical (Canada)
11:20 am5:20 pmBenchtop XRD demoDr. Luciano Gobbo, XRD Applications - Building Materials and Minerals, Malvern Panalytical (USA)
11:40 am5:40 pmDetermination of hardrock lithium concentrates using X-ray diffraction (CRD) in combination with statistical methodsDr. Herbert Pollmann, Head of Department, Institute of Geosciences and Geology, Martin Luther University Halle-Wittenberg (Germany)
12:00 pm6:00 pmApplication of powder X-ray diffraction for defining ore hardnessDr. Craig McClung, Principal Advisor - OBK Productivity and Technology, Rio Tinto Copper Technical, Rio Tinto (USA)
12:20 pm6:20 pmPortable NIR demoDr. Luciano Gobbo, XRD Applications - Building Materials and Minerals, Malvern Panalytical (USA)
12:40 pm6:40 pmPotential of reflectance spectroscopy for vectoring towards and detecting mineralized areas, case study of the Canadian Malartic Au depositDr. Philip Lypaczewski, Faculty Researcher, College of the North Atlantic (Canada)
1:00 pm7:00 pmGeneral questions and answers session