PIXcel1D

Medipix 技術作為專用條帶檢測器

使用 PIXcel1D 偵測器,您將擁有一款專用於 0D 和 1D 應用的條狀偵測器。與傳統的點偵測器相比,其測量速度可快達 255 倍,同時不會影響數據品質。無需冷卻水、液態氮流、計數氣體或耗時的校準,是一種具成本效益的解決方案。

憑藉無與倫比的解析度和動態範圍,PIXcel1D 可用於我們所有的 繞射儀

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Overview

From X-ray powder diffraction to high-resolution thin film studies

The PIXcel1D covers a wide range of 1D applications requiring the medium and lower energy radiation wavelengths namely Cu, Co, Fe, Mn, Cr: 

  • Phase identification and high throughput screening
  • Standardless quantification of mixtures of phases
  • Refinement of crystal structures
  • Phase transitions at non-ambient conditions in combination with our in situ stages
  • Residual stress, texture and phase identification of metals and alloys
  • Powder diffraction from large unit cell crystals
  • Thin film studies.

Specification

Type PIXcel1D detector with Medipix3
Window size 14 mm x 14 mm
Efficiency Cu K >95%
99% Linearity range 0 – 6.5 x 109 cps – Overall
0 - 25 x 106 cps - Column
Energy resolution around Cu K 18%
Maximum count rate Maximum count rate 30 x 109 cps – Overall
120 x 106 cps - Column
Maximum background <0.5 cps - Overall
Active length 14 mm
Smallest step size 0.0016º 2θθ at 240 mm goniometer radius
Supported wavelengths Cu, Co, Fe, Mn, Cr
Defective channels 0