Fast small spot elemental mapping of defects in polymeric samples

Defects in polymers

Fast inorganic characterization of polymer defects is crucial for quality control and is complementary to molecular spectroscopic techniques such as FT-IR and Raman spectroscopy. The latest advances in integrating XRF technology enable bulk analysis together with small spot analysis and elemental mapping on a single platform. The ED core, using SumXcore technology, is capable of simultaneous analysis of the elemental composition of small spots. This enables much faster elemental mapping than commonly used WD-XRF mapping options.

This data sheet describes the small spot mapping, SSM, of a dark spot or defect in a polyolefinic sample. 

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